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參數(shù)資料
| 型號： | A1351LKTTN-T |
| 廠商： | Allegro Microsystems Inc |
| 文件頁數(shù)： | 13/24頁 |
| 文件大小： | 663K |
| 描述： | IC SENSOR HALL EFFECT 4-SIP |
| 產(chǎn)品培訓模塊： | Current Sensor |
| 標準包裝： | 1 |
| 傳感范圍： | 0.055% ~ 0.095% DC/G |
| 類型： | 線性 - 單極，雙極 |
| 電源電壓： | 4.5 V ~ 5.5 V |
| 電流 - 電源： | 10mA |
| 電流 - 輸出（最大）： | 1mA |
| 輸出類型： | 數(shù)字，推挽式 |
| 特點： | 高精度 |
| 工作溫度： | -40°C ~ 125°C |
| 封裝/外殼： | 4-SIP |
| 供應商設(shè)備封裝： | 4-SIP |
| 包裝： | 標準包裝 |
| 產(chǎn)品目錄頁面： | 1139 (CN2011-ZH PDF) |
| 其它名稱： | 620-1228-6 |
A1351
High Precision Linear Hall Effect Sensor IC
with a Push/Pull, Pulse Width Modulated Output
12
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
After the initial 800 ms has elapsed, the duty cycle will cor-
respond to an applied magnetic field as expected. The 800 ms
calibration test time corresponds with a target PWM frequency of
125 Hz. If the PWM frequency is programmed away from its tar-
get of 125 Hz, the duration of the calibration test time will scale
inversely with the change in PWM frequency.
This test mode is optional and must be enabled by blowing its
programming bit. After the test mode bit has been blown, the
device enters Output Calibration mode every time the device is
powered-on. This test mode is provided so that the user can com-
pensate for differences in the ground potential between the A1351
and any interface circuitry used to measure the pulse width of the
A1351 output.
Figure 14. After powering-on, the A1351 outputs a 50% D for the first
800 ms, regardless of the applied magnetic field (Output Calibration mode
in effect). After the initial 800 ms has elapsed, the output responds to a
magnetic field as expected. The example in this figure assumes that a
large +B field is applied to the device after the initial 800 ms.
Output Calibration Mode
PWM output = 50% D
After 800 ms;
PWM output proportional
to applied magnetic field
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