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參數(shù)資料
| 型號： | 5962-8957001PX |
| 英文描述： | Hermetically Sealed, Very High Speed Logic Gate Optocoupler(密封，高速，邏輯門光耦合器) |
| 中文描述： | 密封，超高速邏輯門光電耦合器（密封，高速，邏輯門光耦合器） |
| 文件頁數(shù)： | 1/2頁 |
| 文件大小： | 35K |
| 代理商： | 5962-8957001PX |
Hermetically Sealed, Very High Speed
Logic Gate Optocoupler
Reliability Data Sheet
Description
The reliability data shown
includes Agilent reliability test
data from the past three years on
this product family. All of these
products use the same LEDs, the
same logic gate ICs, the same
DSCC approved packaging
materials, processes, stress
conditions and testing.
The data in Tables 1 and 2 reflect
actual test data on dual channel
devices. The single channel HCPL-
5401 data in Table 3 is inferred
from the demonstrated life test
data using the factor (1.5) found
in the “Photodiode Detector
Isolator” section of MIL-HDBK-
217, combined with any single
channel data obtained. This data
Definition of Failure
Inability to switch, i.e., “functional
failure”, is the definition of failure
in this data sheet. Specifically,
failure occurs when the device
fails to switch ON with 2 times the
minimum recommended drive
current (but not exceeding the
max. rating) or fails to switch OFF
when there is no input current.
Failure Rate Projections
The demonstrated point mean
time to failure (MTTF) is
measured at the absolute
maximum stress condition. The
failure rate projections in Tables 2
and 3 use the Arrhenius
acceleration relationship, where a
0.43 eV activation energy is used
as in the hybrid section of MIL-
HDBK-217.
Applications Information
The data of Tables 1, 2, and 3 were
obtained on MIL-PRF-38534
screened devices with high
temperature operating life
duration up to 5000 hours. An
exponential (random) failure
distribution is assumed, expressed
in units of FIT (failures per billion
is taken from testing on Agilent
Technologies devices using
internal Agilent processes,
material specifications, design
standards, and statistical process
controls. THEY ARE NOT
TRANSFERABLE TO OTHER
MANUFACTURERS’ SIMILAR
PART TYPES.
device hours) are only defined in
the random failure portion of the
reliability curve.
For valid system reliability
calculations, it is necessary to
adjust for the time when the
system is not in operation.
Note that if you are using MIL-
HDBK-217 for predicting
component reliability, the results
may not be comparable to those
given in Tables 2 and 3 due to the
different conditions and factors
Operating Life Test
Table 1. Demonstrated Operating Life Test Performance, HCPL-6431
Demonstrated
MTTF (hr)@
T
A
= +125
°
C
362,500
Demonstrated
FITs @
T
A
= +125
°
C
2759
Stress Test
Condition
Total Devices
Tested
Total Device
Hours
Number of
Failed Units
I
f
= 10 mA
I
out
= -4 mA
V
CC
= 5.25 V
T
A
= +125
°
C
T
j
= +155
°
C
245
725,000
2
Agilent
5962-8957101PX, 5962-8957103KPX
HCPL-5431, HCPL-543K
5962-8957001PX, 5962-8957002KPX
HCPL-5401, HCPL-540K
5962-89571022A, 5962-8957104K2A
HCPL-6431, HCPL-643K
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| 5962-8957001XA | 功能描述:高速光耦合器 40M bit/s 1500Vdc Hermetically sealed RoHS:否 制造商:Avago Technologies 電流傳遞比: 最大波特率: 最大正向二極管電壓:1.75 V 最大反向二極管電壓:5 V 最大功率耗散:40 mW 最大工作溫度:+125 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-5 封裝:Tube |
| 5962-8957001YA | 功能描述:高速光耦合器 40M bit/s 1500Vdc Hermetically sealed RoHS:否 制造商:Avago Technologies 電流傳遞比: 最大波特率: 最大正向二極管電壓:1.75 V 最大反向二極管電壓:5 V 最大功率耗散:40 mW 最大工作溫度:+125 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-5 封裝:Tube |
| 5962-8957001YC | 功能描述:高速光耦合器 40M bit/s 1500Vdc Hermetically sealed RoHS:否 制造商:Avago Technologies 電流傳遞比: 最大波特率: 最大正向二極管電壓:1.75 V 最大反向二極管電壓:5 V 最大功率耗散:40 mW 最大工作溫度:+125 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-5 封裝:Tube |
| 5962-8957002KPA | 功能描述:高速光耦合器 40M bit/s 1500Vdc Hermetically sealed RoHS:否 制造商:Avago Technologies 電流傳遞比: 最大波特率: 最大正向二極管電壓:1.75 V 最大反向二極管電壓:5 V 最大功率耗散:40 mW 最大工作溫度:+125 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-5 封裝:Tube |
| 5962-8957002KPC | 功能描述:高速光耦合器 40M bit/s 1500Vdc Hermetically sealed RoHS:否 制造商:Avago Technologies 電流傳遞比: 最大波特率: 最大正向二極管電壓:1.75 V 最大反向二極管電壓:5 V 最大功率耗散:40 mW 最大工作溫度:+125 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-5 封裝:Tube |
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