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參數資料
| 型號： | 5962-9095803QPA |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 運算放大器 |
| 英文描述： | OP-AMP, 2600 uV OFFSET-MAX, 2 MHz BAND WIDTH, CDIP8 |
| 封裝： | CERAMIC, DIP-8 |
| 文件頁數： | 8/33頁 |
| 文件大?。?/td> | 674K |
| 代理商： | 5962-9095803QPA |
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TLE2161, TLE2161A, TLE2161B
EXCALIBUR JFET-INPUT HIGH-OUTPUT-DRIVE
POWER OPERATIONAL AMPLIFIERS
SLOS049D – NOVEMBER 1989 – REVISED MAY 1996
16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
2 k
8 k
(see Note A)
CL
VO
VCC –
VI
+
–
VCC +
NOTE A: CL includes fixture capacitance.
Figure 1. Slew-Rate Test Circuit
VO
RS
2 k
VCC –
VCC +
+
–
Figure 2. Noise-Voltage Test Circuit
VO
RL
CL
(see Note A)
10 k
100
VI
VCC –
VCC +
+
–
NOTE A: CL includes fixture capacitance.
Figure 3. Gain-Bandwidth Product and Phase-Margin Test Circuit
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
Input bias and offset current
At the picoampere bias-current level typical of the TLE2161, TLE2161A, and TLE2161B, accurate
measurement of the bias current becomes difficult. Not only does this measurement require a picoammeter,
but test socket leakages can easily exceed the actual device bias currents. To accurately measure these small
currents, Texas Instruments uses a two-step process. The socket leakage is measured using picoammeters
with bias voltages applied but with no device in the socket. The device is then inserted into the socket, and a
second test that measures both the socket leakage and the device input bias current is performed. The two
measurements are then subtracted algebraically to determine the bias current of the device.
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