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參數(shù)資料
| 型號： | 62LV256 |
| 廠商： | Integrated Silicon Solution, Inc. |
| 英文描述： | 32K x 8 LOW VOLTAGE STATIC RAM |
| 中文描述： | 32K的× 8低壓靜態(tài)RAM |
| 文件頁數(shù)： | 3/9頁 |
| 文件大小： | 40K |
| 代理商： | 62LV256 |
IS62LV256
ISSI
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
Rev. K
12/11/02
3
OPERATING RANGE
Range
Commercial
Industrial
Ambient Temperature
0°C to +70°C
–40°C to +85°C
V
CC
3.3V ± 5%
3.3V ± 5%
DC ELECTRICAL CHARACTERISTICS
(Over Operating Range)
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min., I
OH
= –1.0 mA
2.4
—
V
V
OL
Output LOW Voltage
V
CC
= Min., I
OL
= 2.1 mA
—
0.4
V
V
IH
Input HIGH Voltage
2.2
V
CC
+ 0.3
V
V
IL
Input LOW Voltage
(1)
–0.3
0.8
V
I
LI
Input Leakage
GND
≤
V
IN
≤
V
CC
Com.
Ind.
–2
–5
2
5
μA
I
LO
Output Leakage
GND
≤
V
OUT
≤
V
CC
, Outputs Disabled
Com.
Ind.
–2
–5
2
5
μA
Notes:
1. V
IL
= –3.0V for pulse width less than 10 ns.
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM
T
BIAS
T
STG
P
T
I
OUT
Parameter
Terminal Voltage with Respect to GND
Temperature Under Bias
Storage Temperature
Power Dissipation
DC Output Current (LOW)
Value
–0.5 to +4.6
–55 to +125
–65 to +150
0.5
20
Unit
V
°C
°C
W
mA
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
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