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參數資料
| 型號： | 6N140A |
| 英文描述： | Hermetically Sealed, Low Current High Gain Optocoupler(密封，小電流高增益光耦合器) |
| 中文描述： | 密封，低電流高增益光電耦合器（密封，小電流高增益光耦合器） |
| 文件頁數： | 1/2頁 |
| 文件大小： | 35K |
| 代理商： | 6N140A |
Hermetically Sealed, Low Current
High Gain Optocoupler
Reliability Data Sheet
Description
The reliability data shown
includes Agilent reliability test
data from the past three years on
this product family. All of these
products use the same LEDs, the
same logic gate ICs, the same
DSCC approved packaging
materials, processes, stress
conditions and testing.
The data in Tables 1 and 2 reflect
actual test data on dual channel
devices. The single channel HCPL-
5701 data in Table 3 is inferred
from the demonstrated life test
data using the factor (1.5) found
in the “Photodiode Detector
Isolator” section of MIL-HDBK-
217, combined with any single
channel data obtained. This data
Definition of Failure
Inability to switch, i.e., “functional
failure”, is the definition of failure
in this data sheet. Specifically,
failure occurs when the device
fails to switch ON with 2 times the
minimum recommended drive
current (but not exceeding the
max. rating) or fails to switch OFF
when there is no input current.
Failure Rate Projections
The demonstrated point mean
time to failure (MTTF) is
measured at the absolute
maximum stress condition. The
failure rate projections in Tables 2
and 3 use the Arrhenius
acceleration relationship, where a
0.43 eV activation energy is used
as in the hybrid section of MIL-
HDBK-217.
Applications Information
The data of Tables 1, 2, and 3 were
obtained on MIL-PRF-38534
screened devices with high
temperature operating life
duration up to 5000 hours. An
exponential (random) failure
distribution is assumed, expressed
in units of FIT (failures per billion
is taken from testing on Agilent
Technologies devices using
internal Agilent processes,
material specifications, design
standards, and statistical process
controls. THEY ARE NOT
TRANSFERABLE TO OTHER
MANUFACTURERS’ SIMILAR
PART TYPES.
device hours) are only defined in
the random failure portion of the
reliability curve.
For valid system reliability
calculations, it is necessary to
adjust for the time when the
system is not in operation.
Note that if you are using MIL-
HDBK-217 for predicting
component reliability, the results
may not be comparable to those
given in Tables 2 and 3 due to the
different conditions and factors
Operating Life Test
Table 1. Demonstrated Operating Life Test Performance, 6N140A/883B
Demonstrated
MTTF (hr)@
T
A
= +125
°
C
881,000
Demonstrated
FITs @
T
A
= +125
°
C
1135
Stress Test
Condition
Total Devices
Tested
Total Device
Hours
Number of
Failed Units
I
f
= 5 mA
I
out
= 10 mA
V
CC
= 18 V
T
A
= +125
°
C
T
j
= +140
°
C
474
1,762,000
2
Agilent
8302401EX, 5962-9800201KEX
6N140A/883B, HCPL-177K
5962-8978501PX, 5962-8978503KPX
HCPL-5731, HCPL-573K
5962-8981001PX, 5962-8981002KPX
HCPL-5701, HCPL-570K
5962-89785022A, 5962-8978504K2A
HCPL-6731, HCPL-673K
8302401FC, 5962-9800201KFC
HCPL-6751, HCPL-675K
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相關代理商/技術參數 |
參數描述 |
|---|---|
| 6N140A#100 | 功能描述:邏輯輸出光電耦合器 4Ch 1500%CTR Hermetically sealed RoHS:否 制造商:Fairchild Semiconductor 絕緣電壓:4243 Vrms 輸出類型:Push-Pull 最大傳播延遲時間:500 ns 最大正向二極管電壓: 最大反向二極管電壓: 最大正向二極管電流: 最大連續輸出電流:2.5 A 最大功率耗散:100 mW 最大工作溫度:+ 100 C 最小工作溫度:- 40 C 封裝 / 箱體:SO-16 封裝:Tube |
| 6N140A#200 | 功能描述:邏輯輸出光電耦合器 4Ch 1500%CTR Hermetically sealed RoHS:否 制造商:Fairchild Semiconductor 絕緣電壓:4243 Vrms 輸出類型:Push-Pull 最大傳播延遲時間:500 ns 最大正向二極管電壓: 最大反向二極管電壓: 最大正向二極管電流: 最大連續輸出電流:2.5 A 最大功率耗散:100 mW 最大工作溫度:+ 100 C 最小工作溫度:- 40 C 封裝 / 箱體:SO-16 封裝:Tube |
| 6N140A#300 | 功能描述:邏輯輸出光電耦合器 4Ch 1500%CTR Hermetically sealed RoHS:否 制造商:Fairchild Semiconductor 絕緣電壓:4243 Vrms 輸出類型:Push-Pull 最大傳播延遲時間:500 ns 最大正向二極管電壓: 最大反向二極管電壓: 最大正向二極管電流: 最大連續輸出電流:2.5 A 最大功率耗散:100 mW 最大工作溫度:+ 100 C 最小工作溫度:- 40 C 封裝 / 箱體:SO-16 封裝:Tube |
| 6N140A#600 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:NPN-OUTPUT DC-INPUT OPTOCOUPLER |
| 6N140A | 制造商:Avago Technologies 功能描述:Optocoupler |
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