
Test
Level
AD9660KR
Typ
Parameter
Temp
Min
Max
Units
Conditions
ANALOG INPUTS
(WRITE LEVEL, BIAS LEVEL)
Input Voltage Range
Input Bias Current
Analog Bandwidth
IV
I
V
Full
+25
°
C
Full
V
REF
–50
V
REF
+ 1.6
+50
V
μ
A
MHz
25
External Hold Cap = 20 pF
OUTPUTS
Maximum Output Current, I
OUT
I
OUT
Bias Current, I
BIAS
Modulation Current, I
MODULATION
Offset Current, I
OFFSET
Output Compliance Range
Idle Current
I
I
I
I
I
I
I
+25
°
C
+25
°
C
+25
°
C
+25
°
C
+25
°
C
+25
°
C
+25
°
C
200
180
90
60
30
0
3
mA
mA
mA
mA
mA
V
mA
V
OUT
= 2.5 V
V
OUT
= 3.0 V
V
OUT
= 3.0 V
V
OUT
= 3.0 V
V
OUT
= 3.0 V
3.0
13
WRITE PULSE = LOW,
DISABLE = HIGH
SWITCHING PERFORMANCE
Maximum Pulse Rate
Output Propagation Delay (t
PD
), Rising
1
Output Propagation Delay (t
PD
), Falling
1
Output Current Rise Time
2
Output Current Fall Time
3
WRITE CAL Aperture Delay
4
Disable Time
5
IV
IV
IV
IV
IV
V
V
+25
°
C
Full
Full
Full
Full
+25
°
C
+25
°
C
200
1.6
1.6
1.1
1.4
250
MHz
ns
ns
ns
ns
ns
ns
3 dB Reduction in I
OUT
3.0
2.5
1.7
2.8
1.5
2.0
13
5
HOLD NODES
(WRITE HOLD, BIAS HOLD)
Input Bias Current
Input Voltage Range
Minimum External Hold Cap
I
IV
V
+25
°
C
Full
Full
–200
V
REF
200
V
REF
+ 1.6
nA
V
pF
V
HOLD
= 2.5 V
Open Loop Application Only
20
TTL INPUTS
6
Logic “1” Voltage
Logic “1” Voltage
Logic “0” Voltage
Logic “0” Voltage
Logic “1” Current
Logic “0” Current
I
IV
I
IV
I
I
+25
°
C
Full
+25
°
C
Full
+25
°
C
+25
°
C
2.0
2.0
V
V
V
V
μ
A
mA
DISABLE = LOW
While Other
TTL Inputs Are
Tested
0.8
0.8
10
–10
–1.5
20
BANDGAP REFERENCE
Output Voltage V
REF
Temperature Coefficient
Output Current
I
V
V
+25
°
C
1.55
1.75
–0.2
1.90
V
mV/
°
C
mA
+25
°
C
–0.5
1.0
SENSE IN
Current Gain
Voltage
Input Resistance
V
I
V
+25
°
C
+25
°
C
+25
°
C
1.85
4.0
<150
mA/mA
V
3.7
4.3
I
MONITOR
= 2 mA
POWER SUPPLY (DISABLE = HIGH)
+V
S
Voltage
+V
S
Current
Power Dissipation
I
I
I
+25
°
C
+25
°
C
+25
°
C
4.75
75
5.00
110
550
5.25
150
V
mA
mW
DISABLE = HIGH
OFFSET CURRENT
OFFSET SET Voltage
I
+25
°
C
1.1
1.4
1.7
V
I
MONITOR
= 4.0 mA
NOTES
1
Propagation delay measured from the 50% of the rising/falling transition of WRITE PULSE to 50% point of the rising/falling edge of the output modulation current.
2
Rise time measured between the 10% and 90% points of the rising transition of the modulation current.
3
Fall time measured between the 10% and 90% points of the falling transition of the modulation current.
4
Aperture Delay is measured from the 50% point of the rising edge of WRITE PULSE to the time when the output modulation begins to recalibrate, WRITE CAL is
held during this test.
5
Disable Time is measured from the 50% point of the rising edge of DISABLE to the 50% point of the falling transition of the output current. Fall time during disable
is similar to fall time during normal operation.
6
WRITE PULSE, WRITE CAL, BIAS CAL, OFFSET PULSE are TTL compatible inputs.
Specifications subject to change without notice.
AD9660–SPECIFICATIONS
REV. 0
–2–
(+V
S
= +5 V, Temperature = +25
°
C unless otherwise noted. Sourced currents defined
as positive.)