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參數資料
型號: ADE7751
廠商: Analog Devices, Inc.
英文描述: Energy Metering IC with On-Chip Fault Detection
中文描述: 電能計量IC片故障檢測
文件頁數: 3/16頁
文件大小: 422K
代理商: ADE7751
REV. 0
–3–
ADE7751
Parameter
LOGIC OUTPUTS
4
F1 and F2
Output High Voltage, V
OH
Value
Unit
Test Conditions/Comments
I
SOURCE
= 10 mA
DV
DD
= 5 V
I
SINK
= 10 mA
DV
DD
= 5 V
4.5
V min
Output Low Voltage, V
OL
0.5
V max
CF, FAULT, and REVP
Output High Voltage, V
OH
I
SOURCE
= 5 mA
DV
DD
= 5 V
I
SINK
= 5 mA
DV
DD
= 5 V
For Specified Performance
5 V – 5%
5 V + 5%
5 V – 5%
5 V + 5%
Typically 2 mA
Typically 1.5 mA
4
V min
Output Low Voltage, V
OL
0.5
V max
POWER SUPPLY
AV
DD
4.75
5.25
4.75
5.25
3
2.5
V min
V max
V min
V max
mA max
mA max
DV
DD
AI
DD
DI
DD
NOTES
1
See Terminology section for explanation of specifications.
2
See plots in Typical Performance Characteristics graphs.
3
See Fault Detection section of data sheet for explanation of fault detection functionality.
4
Sample tested during initial release and after any redesign or process change that may affect this parameter.
Specifications subject to change without notice.
TIMING CHARACTERISTICS
1, 2
Parameter
t
13
t
2
t
3
t
43
t
5
t
6
Value
Unit
Test Conditions/Comments
275
See Table III
1/2 t
2
90
See Table IV
CLKIN/4
ms
sec
sec
ms
sec
sec
F1 and F2 Pulsewidth (Logic Low)
Output Pulse Period. See Transfer Function section.
Time Between F1 Falling Edge and F2 Falling Edge
CF Pulsewidth (Logic High)
CF Pulse Period. See Transfer Function section.
Minimum Time Between F1 and F2 Pulse
NOTES
1
Sample tested during initial release and after any redesign or process change that may affect this parameter.
2
See Figure 1.
3
The pulsewidths of F1, F2, and CF are not fixed for higher output frequencies. See Frequency Outputs F1 and F2 section.
Specifications subject to change without notice.
.
t
2
.
t
3
t
4
.
t
5
.
t
6
t
1
F1
F2
CF
Figure 1. Timing Diagram for Frequency Outputs
(AV
DD
= DV
DD
= 5 V 5%, AGND = DGND = 0 V, On-Chip Reference, CLKIN = 3.58 MHz,
T
MIN
to T
MAX
= –40 C to +85 C.)
相關PDF資料
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ADE7751AAN-REF Energy Metering IC with On-Chip Fault Detection
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