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參數資料
| 型號： | ADG512ABR |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 運動控制電子 |
| 英文描述： | LC2MOS Precision 5 V/3 V Quad SPST Switches |
| 中文描述： | QUAD 1-CHANNEL, SGL POLE SGL THROW SWITCH, PDSO16 |
| 封裝： | 0.150 INCH, SOIC-16 |
| 文件頁數： | 4/11頁 |
| 文件大小： | 124K |
| 代理商： | ADG512ABR |
Single Supply
B Versions
0
8
C to
+70
8
C
Parameter
+25
8
C
Units
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
R
ON
0 V to V
DD
V
typ
max
200
V
D
= +1.5 V, I
S
= –1 mA;
V
DD
= +3 V
V
DD
= +3.6 V
V
D
= 2.6/1 V, V
S
= 1
/
2.6 V;
Test Circuit 2
V
D
= 2.6/1 V, V
S
= 1
/
2.6 V;
Test Circuit 2
V
D
= V
S
= +2.6 V/+1 V;
Test Circuit 3
500
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF)
±
0.025
±
0.1
±
0.025
±
0.1
±
0.05
±
0.2
nA typ
nA max
nA typ
nA max
nA typ
nA max
±
2.5
Drain OFF Leakage I
D
(OFF)
±
2.5
Channel ON Leakage I
D
, I
S
(ON)
±
5
DIGITAL INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current
I
INL
or I
INH
2.4
0.8
V min
V max
0.005
μ
A typ
μ
A max
V
IN
= V
INL
or V
INH
±
0.1
DYNAMIC CHARACTERISTICS
2
t
ON
600
ns typ
ns max
ns typ
ns max
ns typ
R
L
= 300
, C
L
= 35 pF;
V
S
= +1 V; Test Circuit 4
R
L
= 300
, C
L
= 35 pF;
V
S
= +1 V; Test Circuit 4
R
L
= 300
, C
L
= 35 pF;
V
S1
= V
S2
= +1 V; Test Circuit 5
V
S
= 0 V, R
S
= 0
, C
L
= 10 nF;
Test Circuit 6
R
L
= 50
, C
L
= 5 pF, f = 1 MHz;
Test Circuit 7
R
L
= 50
, C
L
= 5 pF, f = 1 MHz;
Test Circuit 8
f = 1 MHz
f = 1 MHz
f = 1 MHz
1200
t
OFF
100
160
Break-Before-Make Time
Delay, t
D
(ADG513 Only)
Charge Injection
500
11
pC typ
OFF Isolation
68
dB typ
Channel-to-Channel Crosstalk
85
dB typ
C
S
(OFF)
C
D
(OFF)
C
D
, C
S
(ON)
POWER REQUIREMENTS
V
DD
I
DD
9
9
35
pF typ
pF typ
pF typ
3/3.6
V min/max
μ
A typ
μ
A max
0.0001
V
DD
= +3.6 V
Digital Inputs = 0 V or 3 V
1
NOTES
1
Temperature ranges are as follows: B Versions –40
°
C to +85
°
C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. B
–4–
ADG511/ADG512/ADG513–SPECIFICATIONS
1
(V
DD
= +3.3 V
6
10%, V
SS
= 0 V, GND = 0 V, unless otherwise noted)
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