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參數(shù)資料
| 型號： | ADM1181AARW |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 通用總線功能 |
| 英文描述： | 5V High-Speed RS-232 Transceivers with 0.1uF Capacitors |
| 中文描述： | DUAL LINE TRANSCEIVER, PDSO16 |
| 封裝： | MS-013AA, SOIC-16 |
| 文件頁數(shù)： | 7/12頁 |
| 文件大?。?/td> | 163K |
| 代理商： | ADM1181AARW |
ADM202E/ADM1181A
–7–
REV. 0
E SD T E ST ING (IE C1000-4-2)
IEC1000-4-2 (previously 801-2) specifies compliance testing
using two coupling methods, contact discharge and air-gap
discharge. Contact discharge calls for a direct connection to the
unit being tested. Air-gap discharge uses a higher test voltage
but does not make direct contact with the unit under test. With
air discharge, the discharge gun is moved towards the unit un-
der test developing an arc across the air gap, hence the term air-
gap discharge. T his method is influenced by humidity, tempera-
ture, barometric pressure, distance and rate of closure of the dis-
charge gun. T he contact-discharge method while less realistic is
more repeatable and is gaining acceptance in preference to the
air-gap method.
Although very little energy is contained within an ESD pulse,
the extremely fast rise time coupled with high voltages can cause
failures in unprotected semiconductors. Catastrophic destruc-
tion can occur immediately as a result of arcing or heating. Even
if catastrophic failure does not occur immediately, the device
may suffer from parametric degradation which may result in de-
graded performance. T he cumulative effects of continuous ex-
posure can eventually lead to complete failure.
I/O lines are particularly vulnerable to ESD damage. Simply
touching or plugging in an I/O cable can result in a static dis-
charge which can damage or completely destroy the interface
product connected to the I/O port. T raditional ESD test meth-
ods such as the MIL-ST D-883B method 3015.7 do not fully
test a product’s susceptibility to this type of discharge. T his test
was intended to test a product’s susceptibility to ESD damage
during handling. Each pin is tested with respect to all other
pins. T here are some important differences between the tradi-
tional test and the IEC test:
a. T he IEC test is much more stringent in terms of discharge
energy. T he peak current injected is over four times greater.
b. T he current rise time is significantly faster in the IEC test.
c. T he IEC test is carried out while power is applied to the device.
It is possible that the ESD discharge could induce latch-up in
the device under test. T his test therefore is more representative
of a real-world I/O discharge where the equipment is operating
normally with power applied. For maximum peace of mind,
however, both tests should be performed therefore ensuring
maximum protection both during handling and later during field
service.
R1
R2
C1
DEVICE
UNDER TEST
HIGH
VOLTAGE
GENERATOR
ESD TEST METHOD
H. BODY MIL-STD883B
IEC1000-4-2
R2
1.5k
330
C1
100pF
150pF
Figure 12. ESD Test Standards
100
I
P
90
36.8
10
t
DL
t
RL
TIME t
Figure 13. Human Body Model ESD Current Waveform
100
I
P
90
10
TIME t
30ns
60ns
0.1 TO 1ns
Figure 14. IEC1000-4-2 ESD Current Waveform
T he ADM202E/ADM1181E products are tested using both the
above mentioned test methods. All pins are tested with respect
to all other pins as per the MIL-ST D-883B specification. In ad-
dition all I/O pins are tested as per the IEC test specification.
T he products were tested under the following conditions:
a. Power-On
b. Power-Off
T here are four levels of compliance defined by IEC1000-4-2.
T he ADM202E/ADM1181A products meet the most stringent
compliance level for both contact and for air-gap discharge.
T his means that the products are able to withstand contact dis-
charges in excess of 8 kV and air-gap discharges in excess of
15 kV.
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| ADM203 | Low Power 5V RS232 Dual Driver/Receiver with 0.1?μF Capacitors; Package: SO; No of Pins: 16; Temperature Range: -40?°C to 85?°C |
| ADM202JRW | Low Power 5V RS232 Dual Driver/Receiver with 0.1?μF Capacitors; Package: SO; No of Pins: 16; Temperature Range: -40?°C to 85?°C |
| ADM202JN | Low Power 5V RS232 Dual Driver/Receiver with 0.1?μF Capacitors; Package: SO; No of Pins: 16; Temperature Range: -40?°C to 85?°C |
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| ADM1181AARW-REEL | 制造商:Analog Devices 功能描述:Dual Transmitter/Receiver RS-232 16-Pin SOIC W T/R |
| ADM1181AARWZ | 功能描述:IC TXRX RS-232 5V 15KV 16SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發(fā)器 系列:- 產品培訓模塊:RS-232 & USB Transceiver 標準包裝:2,000 系列:- 類型:收發(fā)器 驅動器/接收器數(shù):1/1 規(guī)程:RS232 電源電壓:3 V ~ 5.5 V 安裝類型:表面貼裝 封裝/外殼:16-SSOP（0.209"，5.30mm 寬） 供應商設備封裝:16-SSOP 包裝:帶卷 (TR) 其它名稱:296-19849-2 |
| ADM1181AARWZ-REEL | 功能描述:IC TXRX RS-232 5V 15KV 16SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發(fā)器 系列:- 標準包裝:121 系列:- 類型:收發(fā)器 驅動器/接收器數(shù):1/1 規(guī)程:RS422，RS485 電源電壓:3 V ~ 3.6 V 安裝類型:表面貼裝 封裝/外殼:10-WFDFN 裸露焊盤 供應商設備封裝:10-DFN（3x3） 包裝:管件 |
| ADM1184 | 制造商:AD 制造商全稱:Analog Devices 功能描述:0.8% Accurate Quad Voltage Monitor |
| ADM1184ARMZ | 功能描述:IC VOLT MONITOR/SEQ 4CH 10MSOP RoHS:是 類別:集成電路 (IC) >> PMIC - 監(jiān)控器 系列:- 其它有關文件:STM6905 View All Specifications 標準包裝:1 系列:- 類型:多壓監(jiān)控器 監(jiān)視電壓數(shù)目:5 輸出:開路漏極或開路集電極 復位:低有效 復位超時:最小為 140 ms 電壓 - 閥值:2.188V，2.955V，可調，可調，可調 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:8-TSSOP，8-MSOP（0.118"，3.00mm 寬） 供應商設備封裝:8-TSSOP 包裝:Digi-Reel® 產品目錄頁面:1197 (CN2011-ZH PDF) 其它名稱:497-8728-6 |
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