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參數資料
| 型號： | ADM487E |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 5 V, 【15 kV ESD Protected Half-Duplex, RS-485/RS-422 Transceivers |
| 中文描述： | 5，【15千伏ESD保護半V型雙工，RS-485/RS-422收發器 |
| 文件頁數： | 14/16頁 |
| 文件大小： | 297K |
| 代理商： | ADM487E |
ADM485E/ADM487E/ADM1487E
ESD Testing
Two coupling methods are used for ESD testing: contact
discharge and air-gap discharge. Contact discharge calls for
a direct connection to the unit being tested; air-gap discharge
uses a higher test voltage but does not make direct contact with
the unit under test. With air discharge, the discharge gun is moved
toward the unit under test, developing an arc across the air gap;
hence the term air discharge. This method is influenced by
humidity, temperature, barometric pressure, distance, and rate
of closure of the discharge gun. The contact-discharge method,
though less realistic, is more repeatable and is gaining accep-
tance and preference over the air-gap method.
Although very little energy is contained within an ESD pulse,
the extremely fast rise time, coupled with high voltages, can
cause failures in unprotected semiconductors. Catastrophic
destruction can occur immediately as a result of arcing or heating.
Even if catastrophic failure does not occur immediately, the
device can suffer from parametric degradation, which can result
in degraded performance. The cumulative effects of continuous
exposure can eventually lead to complete failure.
Rev. 0 | Page 14 of 16
C1
R2
HIGH
VOLTAGE
GENERATOR
DEVICE
UNDER TEST
0
ESD TEST METHOD
HUMAN BODY MODEL
R2
±15kV
C1
100pF
Figure 27. ESD Generator
I/O lines are particularly vulnerable to ESD damage. Simply
touching or plugging in an I/O cable can result in a static
discharge that can damage or completely destroy the inter
face product connected to the I/O port. It is, therefore, extremely
important to have high levels of ESD protection on the I/O lines.
The ESD discharge can induce latch-up in the device under test.
Therefore, it is important that ESD testing on the I/O pins be
carried out while device power is applied. This type of testing
is more representative of a real-world I/O discharge where the
equipment is operating normally when the discharge occurs.
100%
90%
36.8%
10%
TIME (
t
)
I
P
t
RL
t
DL
0
Figure 28. Human Body Model ESD Current Waveform
Table 9. ADM483E ESD Test Results
ESD Test Method
Human Body Model (HBM)
I/O Pins
±15 kV
Other Pins
±3.5 V
相關PDF資料 |
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| ADM487EARZ | 5 V, 【15 kV ESD Protected Half-Duplex, RS-485/RS-422 Transceivers |
| ADM487EARZ-REEL7 | 5 V, 【15 kV ESD Protected Half-Duplex, RS-485/RS-422 Transceivers |
| ADM1487 | Ultra-Low Power RS-485/RS-422 Transceiver with Low EMI and +/-10kV ESD Protection |
| ADM1487AN | Ultra-Low Power RS-485/RS-422 Transceiver with Low EMI and +/-10kV ESD Protection |
| ADM1487AR | Ultra-Low Power RS-485/RS-422 Transceiver with Low EMI and +/-10kV ESD Protection |
相關代理商/技術參數 |
參數描述 |
|---|---|
| ADM487EARZ | 功能描述:IC TXRX HALF DUP RS485/422 8SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發器 系列:- 產品培訓模塊:RS-232 & USB Transceiver 標準包裝:2,000 系列:- 類型:收發器 驅動器/接收器數:1/1 規程:RS232 電源電壓:3 V ~ 5.5 V 安裝類型:表面貼裝 封裝/外殼:16-SSOP（0.209"，5.30mm 寬） 供應商設備封裝:16-SSOP 包裝:帶卷 (TR) 其它名稱:296-19849-2 |
| ADM487EARZ-REEL7 | 功能描述:IC TXRX HALF DUP RS485/422 8SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發器 系列:- 標準包裝:121 系列:- 類型:收發器 驅動器/接收器數:1/1 規程:RS422，RS485 電源電壓:3 V ~ 3.6 V 安裝類型:表面貼裝 封裝/外殼:10-WFDFN 裸露焊盤 供應商設備封裝:10-DFN（3x3） 包裝:管件 |
| ADM487EWARZ | 功能描述:IC TXRX HALF DUP RS485/422 8SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發器 系列:- 標準包裝:27 系列:- 類型:收發器 驅動器/接收器數:3/3 規程:RS232，RS485 電源電壓:4.75 V ~ 5.25 V 安裝類型:表面貼裝 封裝/外殼:28-SOIC（0.295"，7.50mm 寬） 供應商設備封裝:28-SOIC 包裝:管件 |
| ADM487EWARZ-REEL7 | 功能描述:IC TXRX HALF DUP RS485/422 8SOIC RoHS:是 類別:集成電路 (IC) >> 接口 - 驅動器，接收器，收發器 系列:- 標準包裝:121 系列:- 類型:收發器 驅動器/接收器數:1/1 規程:RS422，RS485 電源電壓:3 V ~ 3.6 V 安裝類型:表面貼裝 封裝/外殼:10-WFDFN 裸露焊盤 供應商設備封裝:10-DFN（3x3） 包裝:管件 |
| ADM488 | 制造商:AD 制造商全稱:Analog Devices 功能描述:Full-Duplex, Low Power, Slew Rate Limited, EIA RS-485 Transceivers |
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