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參數資料
| 型號： | ADM6822ZART-RL |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 電源管理 |
| 英文描述： | Low Voltage Supervisory Circuits with Watchdog & Manual Reset in 5-Lead SOT-23 |
| 中文描述： | 1-CHANNEL POWER SUPPLY MANAGEMENT CKT, PDSO5 |
| 封裝： | MO-178AA, SOT-23, 5 PIN |
| 文件頁數： | 3/7頁 |
| 文件大小： | 133K |
| 代理商： | ADM6822ZART-RL |
Preliminary Technical Data
ADM6821–ADM6825
Parameter
Rev.PrA | Page 3 of 7
Min
0.8
×
V
CC
Typ
Max
Units
V
Test Conditions/Comments
V
CC
>=3.15V, I
SOURCE
=500uA,
reset not asserted
V
CC
>=1.8V, I
SOURCE
=200uA,
reset not asserted
V
CC
>=4.25V, I
SOURCE
=800uA,
reset asserted
V
CC
>=2.55V, I
SOURCE
=500uA,
reset asserted
V
CC
>=1.50V, I
SOURCE
=100uA,
reset asserted
V
CC
>=1.0V, I
SOURCE
=1uA,
reset asserted, T
A
=-40°C to +85°C
V
CC
>=4.75V, I
SINK
=3.2mA,
reset not asserted
V
CC
>=3.15V, I
SINK
=1.2mA,
reset not asserted
V
CC
>=1.8V, I
SINK
=500uA,
reset not asserted
V
IL
=0.4V, V
IH
=0.8
×
V
CC
,
V
WDI
= V
CC
, time average
V
WDI
=0, time average
0.8
×
V
CC
V
RESET Output Voltage High
0.8
×
V
CC
0.8
×
V
CC
0.8
×
V
CC
0.8
×
V
CC
RESET Output Voltage Low
0.4
V
0.3
V
0.3
V
WATCHDOG INPUT (ADM6821-ADM6824)
Watchdog Timeout Period
WDI Pulse Width
WDI Input Threshold
V
IL
V
IH
WDI Input Current
1.12
50
0.7xV
CC
-20
0.7xV
CC
1
25
1.6
120
-15
100
50
200
2.40
0.3xV
CC
160
0.3xV
CC
75
s
ns
V
V
μA
μA
V
V
μs
ns
k
ns
MANUAL RESET INPUT (ADM6821-ADM6823/ADM6825)
MR Input Threshold
MR Input Pulse Width
MR Glitch Rejection
MR Pull-up Resistance
MR to Reset Delay
ABSOLUTE MAXIMUM RATINGS
Table 3. T
A
= 25°C unless otherwise noted.
Parameter
V
CC
Output Current (RESET, RESET)
Operating Temperature Range
Storage Temperature Range
θ
JA
Thermal Impedance
Lead Temperature
Soldering (10 sec)
Vapour Phase (60 sec)
Infrared (15 sec)
Rating
-0.3V to +6V
20mA
-40°C to +125°C
-65°C to +150°C
270°C/W
300°C
215°C
220°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
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