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參數(shù)資料
| 型號： | ADT14GP |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 溫度/濕度傳感器 |
| 英文描述： | Circular Connector; No. of Contacts:61; Series:LJT07R; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:25; Circular Contact Gender:Socket; Circular Shell Style:Jam Nut Receptacle; Insert Arrangement:25-61 |
| 中文描述： | ANALOG TEMP SENSOR-VOLTAGE, 2.49-2.52V, 3Cel, RECTANGULAR, THROUGH HOLE MOUNT |
| 封裝： | PLASTIC, DIP-16 |
| 文件頁數(shù)： | 3/16頁 |
| 文件大小： | 338K |
| 代理商： | ADT14GP |
ADT14
–3–
REV. 0
WAFER TEST LIMITS
Parameter
Symbol
Conditions
Min
Typ
Max
Units
INPUTS SET HIGH, SET LOW
Input Bias Current
I
B
70
nA
OUTPUT VPTAT
Temperature Accuracy
T
A
= +25
°
C, No Load
1.5
°
C
OUTPUT V
REF
Nominal Value
Line Regulation
Load Regulation
V
REF
T
A
= +25
°
C, No Load
4.5 V
≤
V
≤
13.2 V
10
μ
A
≤
IV
REF
≤
500
μ
A
2.490
2.510
±
0.08
±
0.25
V
%/V
%/mA
OPEN-COLLECTOR OUTPUTS OVER, UNDER
Output Low Voltage
Output Leakage Current
V
OL
I
OH
I
SINK
= 1.6 mA
0.4
100
V
μ
A
POWER SUPPLY
Supply Range
Supply Current
V+
I
SY
4.5
5.5
600
V
μ
A
Unloaded
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly and nominal yield loss, yield after packaging is not guaranteed for
standard product dice. Consult factory to negotiate specifications based on lot qualification through sample lot assembly and testing.
DICE CHARACTERISTICS
Die Size 0.069
×
0.080 inch, 5520 sq. mils
(1.75
×
2.03 mm, 3.55 sq. mm)
Transistor Count: 130
(V+ = +5 V, GND = 0 V, T
A
= +25
8
C unless otherwise noted)
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADT14 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
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