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參數資料
型號: ADXRS614
廠商: Analog Devices, Inc.
英文描述: 【50∑/s Yaw Rate Gyro
中文描述: 【50Σ/ s的偏航速率陀螺
文件頁數: 10/12頁
文件大小: 640K
代理商: ADXRS614
ADXRS614
behavior. Typical ratiometricity error for null, sensitivity, self-
test, and temperature output is outlined in Table 3.
Rev. 0 | Page 10 of 12
Note that V
RATIO
must never be greater than AV
CC.
Table 3. Ratiometricity Error for Various Parameters
Parameter
V
S
= V
RATIO
= 4.75 V
ST1
Mean
0.4%
Sigma
0.6%
ST2
Mean
0.4%
Sigma
0.6%
Null
Mean
0.04%
Sigma
0.3%
Sensitivity
Mean
0.03%
Sigma
0.1%
V
TEMP
Mean
0.3%
Sigma
0.1%
V
S
= V
RATIO
= 5.25 V
0.3%
0.6%
0.3%
0.6%
0.02%
0.2%
0.1%
0.1%
0.5%
0.1%
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetrical output swing
may be suitable in some applications. Null adjustment is
possible by injecting a suitable current to SUMJ (1C, 2C). Note
that supply disturbances may reflect some null instability.
Digital supply noise should be avoided particularly in this case.
SELF-TEST FUNCTION
The ADXRS614 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. It is activated by standard logic high levels
applied to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1
causes the voltage at RATEOUT to change about 1.9 V, and
ST2 causes an opposite change of +1.9 V. The self-test response
follows the viscosity temperature dependence of the package
atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage of greater than
0.8 × V
RATIO
to the ST1 and ST2 pins. ST1 and ST2 are
deactivated by applying a voltage of less than 0.2 × V
RATIO
to the
ST1 pin and the ST2 pin. The voltage applied to ST1 and ST2
must never be greater than AV
CC
.
CONTINUOUS SELF-TEST
The one-chip integration of the ADXRS614 gives it higher
reliability than is obtainable with any other high volume
manufacturing method. In addition, it is manufactured under a
mature BiMOS process with field-proven reliability. As an
additional failure detection measure, a power-on self-test can be
performed. However, some applications may warrant
continuous self-test while sensing rate. Details outlining
continuous self-test techniques are also available in a separate
application note.
相關PDF資料
PDF描述
ADXRS614BBGZ 【50∑/s Yaw Rate Gyro
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相關代理商/技術參數
參數描述
ADXRS614BBGZ 制造商:Analog Devices 功能描述:50 DEGREE/S YAW RATE GYRO
ADXRS614BBGZ-RL 功能描述:IC SENSOR GYRO 25MV 50D/S 32CBGA RoHS:是 類別:傳感器,轉換器 >> 陀螺儀 系列:- 標準包裝:1 系列:* 其它名稱:Q6417771
ADXRS614WBBGZA-RL 制造商:Analog Devices 功能描述:?50/S YAW RATE GYRO - Tape and Reel
ADXRS620 制造商:AD 制造商全稱:Analog Devices 功能描述:±300°/sec Yaw Rate Gyro
ADXRS620BBGZ 功能描述:IC GYROSCOPE YAW RATE 32-CBGA RoHS:否 類別:傳感器,轉換器 >> 陀螺儀 系列:* 標準包裝:1 系列:* 其它名稱:Q6417771
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