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參數資料
| 型號： | ARV242 |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | Array chip resistors size 4 X 0603 |
| 中文描述： | 陣列芯片電阻的大小4 × 0603 |
| 文件頁數： | 5/6頁 |
| 文件大小： | 113K |
| 代理商： | ARV242 |
voltage proof on
insulation
short time overload room temperature; P = 6.25
×
P
n
;
5 s (V
≤
2
×
V
max
)
bending
resistors mounted on a 90 mm glass epoxy
resin PCB (FR4), bending: 5 mm
maximum voltage (RMS) during 1 minute,
metal block method
no breakdown or flashover
R/R max.:
±
(1% +0.05
)
R/R max.:
±
(2% +0.1
)
no visible damage
R/R max.:
±
(0.5% +0.05
)
no visible damage
R/R max.:
±
(1% +0.05
)
R/R max.:
±
(1% +0.05
)
14 (Na)
rapid change of
temperature
30 minutes at LCT and
30 minutes at UCT; 5 cycles
R/R max.:
±
(0.5% +0.05
)
R/R max.:
±
(1% +0.05
)
R/R max.:
±
(2% +0.1
)
R/R max.:
±
(2% +0.1
)
R/R max.:
±
(2% +0.1
)
3 (Ca)
damp heat
(steady state)
endurance
56 days; 40
±
2
°
C; 93 +2/
3% RH;
loaded with 0.01 P
n
1000 +48
/
0 hours; 70
±
2
°
C; loaded with
P
n
or V
max
; 1.5 hours on and 0.5 hours off
1000 +48/
0 hours; no load
R/R max.:
±
(3% +0.1
)
R/R max.:
±
(2% +0.1
)
R/R max.:
±
(2% +0.1
)
R/R max.:
±
(1% +0.05
)
R/R max.:
±
(1% +0.05
)
R/R max.:
±
(1% +0.05
)
27 (Ba)
enduranceatupper
category
temperature
temperature
coefficient
at 20/LCT/20
°
C and 20/UCT/20
°
C
≤±
200
×
10
6
/K
≤±
100
×
10
6
/K
≤±
200
×
10
6
/K
sts in accordance with IEC 60115 clauses and IEC 60068 test method
20 (Ta)
solderability
(after ageing)
8 hours steam or 16 hours 155
°
C;
unmounted chips completely immersed for
2
±
0.5 s in a solder bath at 235
±
2
°
C
voltage (DC) after 1 minute,
metal block method: 10 V
IEC publication 60195 (measured with
Quantech-equipment):
R
≤
100
100
< R
≤
1 k
1 k
< R
≤
10 k
10 k
< R
≤
100 k
100 k
< R
≤
1 M
good tinning (
≥
95% covered);
no damage
insulation
resistance
noise
R
ins
min.: 10
3
M
max. 0.316
μ
V/V (
10 dB)
max. 1
μ
V/V (0 dB)
max. 3
μ
V/V (9.54 dB)
max. 6
μ
V/V (15.56 dB)
max. 10
μ
V/V (20 dB)
IEC
60068-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
ARC241
ARV241
ARC242
ARV242
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