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參數(shù)資料
| 型號： | CD-700-LAF-NFB-24.704 |
| 廠商： | VECTRON INTERNATIONAL |
| 元件分類： | XO, clock |
| 英文描述： | PHASE LOCKED LOOP, CQCC16 |
| 封裝： | 5 X 7.50 MM, 2 MM HEIGHT, HERMETIC SEALED, CERAMIC, SMD-16 |
| 文件頁數(shù)： | 8/14頁 |
| 文件大小： | 123K |
| 代理商： | CD-700-LAF-NFB-24.704 |
CD-700, VCXO Based PLL
Vectron International, 267 Lowell Rd, Hudson NH 03051-4916
Tel: 1-88-VECTRON-1
Web: www.vectron.com
Page 3 of 14
Rev : 06Apr08
Test Conditions (25
±5°C)
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Symbol
Ratings
Unit
Power Supply
VDD
7
Vdc
Storage Temperature
Tstorage
-55/125
°C
Soldering Temperature/Duration
TPEAK / tP
260 / 40
°C/sec
Clock and Data Input Range
CLKIN, DATAIN
Gnd-0.5 to VDD +0.5
V
Reliability
The CD-700 is capable of meeting the following qualification tests.
Table 3. Environmental Compliance
Parameter
Conditions
Mechanical Shock
MIL-STD-883, Method 2002
Mechanical Vibration
MIL-STD-883, Method 2007
Solderability
MIL-STD-883, Method 2003
Gross and Fine Leak
MIL-STD-883, Method 1014, 100% Tested
Resistance to Solvents
MIL-STD-883, Method 2016
Handling Precautions
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model (HBM) and a Charged Device
Model (CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are
dependent on the circuit parameters used to define the model.
Table 4. Predicted ESD Ratings
Model
Minimum
Conditions
Human Body Model
1500 V
MIL-STD 883, Method 3015
Charged Device Model
1000 V
JESD 22-C101
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