
7-798
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright Intersil Corporation 1999
CD4029BMS
CMOS Presettable Up/Down Counter
Description
CD4029BMS consists of a four-stage binary or BCD-decade up/
down counter with provisions for look-ahead carry in both count-
ing modes. The inputs consist of a single CLOCK, CARRY-IN
(CLOCK ENABLE), BINARY/DECADE, UP/DOWN, PRESET
ENABLE, and four individual JAM signals. Q1, Q2, Q3, Q4 and a
CARRY OUT signal are provided as outputs.
A high PRESET ENABLE signal allows information on the JAM
INPUTS to preset the counter to any state asynchronously with
the clock. A low on each JAM line, when the PRESET-ENABLE
signal is high, resets the counter to its zero count. The counter is
advanced one count at the positive transition of the clock when
the CARRY-IN and PRE-SET ENABLE signals are low.
Advancement is inhibited when the CARRY-IN or PRESET
ENABLE signals are high. The CARRY-OUT signal is normally
high and goes low when the counter reaches its maximum count
in the UP mode or the minimum count in the DOWN mode pro-
vided the CARRY-IN signal is low. The CARRY-IN signal in the
low state can thus be considered a CLOCK ENABLE. The
CARRY-IN terminal must be connected to VSS when not in use.
Binary counting is accomplished when the BINARY/DECADE
input is high; the counter counts in the decade mode when the
BINARY/DECADE input is low. The counter counts up when the
UP/DOWN input is high, and down when the UP/DOWN input is
low. Multiple packages can be connected in either a parallel-
clocking or a ripple-clocking arrangement as shown in Figure 17.
Parallel clocking provides synchronous control and hence faster
response from all counting outputs. Ripple-clocking allows for
longer clock input rise and fall times.
The CD4029BMS is supplied in these 16-lead outline packages:
Braze Seal DIP
H4X
Frit Seal DIP
H1F
Ceramic Flatpack H6W
Features
High-Voltage Type (20V Rating)
Medium Speed Operation: 8MHz (Typ.) at CL = 50pF
and VDD - VSS = 10V
Multi-Package Parallel Clocking for Synchronous High
Speed Output Response or Ripple Clocking for Slow
Clock Input Rise and Fall Times
“Preset Enable” and Individual “Jam” Inputs Provided
Binary or Decade Up/Down Counting
BCD Outputs in Decade Mode
100% Tested for Maximum Quiescent Current at 20V
5V, 10V and 15V Parametric Ratings
Standardized Symmetrical Output Characteristics
Maximum Input Current of 1
μ
A at 18V Over Full Pack-
age-Temperature Range; 100nA at 18V and +25
o
C
Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
Meets All Requirements of JEDEC Tentative Stan-
dards No. 13B, “Standard Specifications for Descrip-
tion of “B” Series CMOS Device’s
Applications
Programmable Binary and Decade Counting/Fre-
quency Synthesizers-BCD Output
Analog to Digital and Digital to Analog Conversion
Up/Down Binary Counting
Difference Counting
Magnitude and Sign Generation
Up/Down Decade Counting
December 1992
File Number
3304
Pinout
CD4029BMS
TOP VIEW
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
PRESET ENABLE
Q4
JAM 4
JAM 1
CARRY IN
Q1
VSS
CARRY OUT
VDD
Q3
JAM 3
JAM 2
Q2
UP/DOWN
BINARY/DECADE
CLOCK
Functional Diagram
13
12
16
PRESET
ENABLE
1
4
3
1
2
3
4
JAM INPUTS
VDD
CARRY IN
(CLOCK
ENABLE)
5
9
10
15
BINARY/
DECADE
UP/DOWN
CLOCK
8
VSS
7
2
14
11
6 Q1
Q2
Q3
Q4
CARRY
OUT
BUFFERED
OUTPUTS