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參數資料
| 型號： | DDU4F-5500MC2 |
| 英文描述： | Delay Line |
| 中文描述： | 延遲線 |
| 文件頁數： | 4/4頁 |
| 文件大小： | 82K |
| 代理商： | DDU4F-5500MC2 |
DDU4F
Doc #97033
DATA DELAY DEVICES, INC.
4
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DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature:
25
o
C
±
3
o
C
Supply Voltage (Vcc):
Input Pulse:
OUTPUT:
Load:
C
load
:
Threshold:
1 FAST-TTL Gate
5pf
±
10%
1.5V (Rising & Falling)
5.0V
±
0.1V
High = 3.0V
±
0.1V
Low = 0.0V
±
0.1V
50
Max.
3.0 ns Max. (measured
between 0.6V and 2.4V )
PW
IN
= 1.5 x Total Delay
PER
IN
= 10 x Total Delay
Source Impedance:
Rise/Fall Time:
Pulse Width:
Period:
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
T1
OUT
TRIG
IN
REF
TRIG
Test Setup
DEVICE UNDER
TEST (DUT)
TIME INTERVAL
COUNTER
PULSE
GENERATOR
COMPUTER
SYSTEM
PRINTER
IN
T2
T3
T4
T5
Timing Diagram For Testing
T
RISE
T
FALL
PER
IN
PW
IN
T
RISE
T
FALL
0.6V
0.6V
2.4V
1.5V
1.5V
1.5V
V
IH
V
IL
V
OH
V
OL
INPUT
SIGNAL
OUTPUT
SIGNAL
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