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參數資料
| 型號： | DG181AA |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 運動控制電子 |
| 英文描述： | High-Speed Drivers with JFET Switch |
| 中文描述： | DUAL 1-CHANNEL, SGL POLE SGL THROW SWITCH, MBCY10 |
| 文件頁數： | 4/8頁 |
| 文件大小： | 77K |
| 代理商： | DG181AA |
DG180/181/182
Vishay Siliconix
www.vishay.com FaxBack 408-970-5600
4-4
Document Number: 70031
S-52895—Rev. D, 16-Jun-97
Test Conditions
Unless Specified
A Suffix
–55 to 125 C
B Suffix
–25 to 85 C
Parameter
Symbol
V+ = 15 V, V– = –15 V, V
= 5 V
V
R
= 0 V, V
IN
= 2 V, 0.8 V
Temp
b
Typ
c
Min
d
Max
d
Min
d
Max
d
Unit
Analog Switch
Analog Signal Range
e
V
ANALOG
Full
–7.5
15
–7.5
15
V
Drain-Source
On-Resistance
r
DS(on)
I
S
= –10 mA, V
D
= –7.5 V
Room
Full
18
30
60
50
75
Source Off
Leakage Current
I
S(off)
V
=
V+ = 10 V, V– = –20 V
10 V, V
=
10 V
Room
Hot
0.05
1
100
5
100
V
S
=
7.5 V, V
D
=
7.5 V
Room
Hot
0.07
1
100
5
100
Drain Off
Leakage Current
I
D(off)
V
=
V+ = 10 V, V– = –20 V
10 V, V
=
10 V
Room
Hot
0.5
1
100
5
100
nA
V
S
=
7.5 V, V
D
=
7.5 V
Room
Hot
0.6
1
100
5
100
Channel On
Leakage Current
I
D(on)
V
D
= V
S
=
7.5 V
Room
Hot
–0.02
–2
–200
–10
–200
Digital Input
Input Current with
Input Voltage High
I
INH
V
IN
= 5 V
Room
Hot
<0.01
10
20
10
20
A
Input Current with
Input Voltage Low
I
INL
V
IN
= 0 V
Full
–30
–250
–250
Dynamic Characteristics
Turn-On Time
t
on
See Switching Time Test Circuit
Room
85
150
180
ns
Turn-Off Time
t
off
Room
95
130
150
Source-Off Capacitance
C
S(off)
f = 1 MHz
V
S
= –5 V, I
D
= 0
Room
9
Drain-Off Capacitance
C
D(off)
V
D
= –5 V, I
S
= 0
Room
6
pF
Channel-On Capacitance
C
D(on)
V
D
= V
S
= 0 V
Room
14
Off Isolation
OIRR
f = 1 MHz, R
L
= 75
Room
>50
dB
Power Supplies
Positive Supply Current
I+
V
IN
= 0 V, or 5 V
Room
0.6
1.5
1.5
Negative Supply Current
I–
Room
–2.7
–5
–5
mA
Logic Supply Current
I
L
Room
3.1
4.5
4.5
Reference Supply Current
I
R
Room
–1
–2
–2
Notes:
a.
b.
c.
d.
e.
f.
Refer to PROCESS OPTION FLOWCHART
.
Room = 25 C, Full = as determined by the operating temperature suffix.
Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
Guaranteed by design, not subject to production test.
V
IN
= input voltage to perform proper function.
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