集成電路 (IC) SN74ABT8652DLR品牌、價(jià)格、PDF參數(shù)
SN74ABT8652DLR • 品牌、價(jià)格
| 元器件型號(hào) |
廠商 |
描述 |
數(shù)量 |
價(jià)格 |
| SN74ABT8652DLR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
0 |
|
| SN74ABT8646DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8646DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8543DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8543DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT18640DLRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
0 |
|
| SN74ABT18504PMRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
| SN74ABT18504PMR |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
| SN74BCT8374ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
0 |
|
| SN74BCT8374ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
0 |
|
| SN74BCT8373ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
0 |
|
| SN74BCT8245ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
0 |
|
| SN74BCT8240ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
0 |
|
| SN74BCT8240ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
0 |
|
| SN74BCT29854DWRE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
| SN74BCT29854DWE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
| SN74AS181ANTE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-PDIP |
0 |
|
| SN74AS181ADWRE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
| SN74AS181ADWR |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
| SN74AS181ADWE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
SN74ABT8652DLR • PDF參數(shù)
| 類別: |
集成電路 (IC)
|
| 邏輯類型: |
掃描測(cè)試設(shè)備，帶總線收發(fā)器和寄存器
|
| 電源電壓: |
4.5 V ~ 5.5 V
|
| 位數(shù): |
8
|
| 工作溫度: |
-40°C ~ 85°C
|
| 安裝類型: |
表面貼裝
|
| 封裝/外殼: |
28-BSSOP（0.295"，7.50mm 寬）
|
| 供應(yīng)商設(shè)備封裝: |
28-SSOP
|
| 包裝: |
帶卷 (TR)
|