| 元器件型號 | 廠商 | 描述 | 數量 | 價格 |
|---|---|---|---|---|
| SN74LS297NE4 | Texas Instruments | IC DIG PLL FILTER 16-DIP | 0 | 25:$21.42000 |
| SN74LS294NE4 | Texas Instruments | IC PROG FREQ DIV/TIMER 16-DIP | 0 | 25:$17.68000 |
| SN74FB1653PCAG4 | Texas Instruments | IC STORAGE TXRX UNIV 100-HLQFP | 0 | 90:$17.57500 |
| SN74FB1651PCAG4 | Texas Instruments | IC UNIV STORAGE TXRX 100TQFP | 0 | 900:$17.55600 |
| 74ABTH182646APMG4 | Texas Instruments | IC 18BIT SCAN TEST DEV 64-LQFP | 0 | 160:$15.95800 |
| SN74ABT18652PMG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 160:$15.55500 |
| SN74ABT18646PMG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 160:$15.55500 |
| SN74FB1650PCAG4 | Texas Instruments | IC STORAGE TXRX UNIV 100-HLQFP | 0 | 900:$14.63000 |
| SN74ABTH18652APMG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 160:$14.02500 |
| 74LVTH182652APMG4 | Texas Instruments | IC 18BIT TXRX REGISTER 64-LQFP | 0 | 160:$13.94000 |
| SN74LVTH18652APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 0 | 160:$13.94000 |
| SN74ABT18504PMG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 0 | 160:$13.60000 |
| SN74ABT18502PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 1,000:$13.16700 |
| SN74ABT18502PMR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 1,000:$13.16700 |
| SN74ABTH18646APMG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 0 | 1,600:$10.97250 |
| 74LVTH182646APMG4 | Texas Instruments | IC 18BIT TXRX REGISTER 64-LQFP | 0 | 1,600:$10.90600 |
| SN74BCT8373ANTE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 0 | 60:$10.04500 |
| SN74BCT8244ANTE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 0 | 60:$10.04500 |
| SN74ABT8646DWG4 | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 0 | 60:$9.94250 |
| SN74ABT8646DWE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 0 | 60:$9.94250 |
| CLVT8996DWG4 | Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 0 | 75:$9.22507 |
| SN74BCT8374ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8373ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8240ADWG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8374ADWE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 0 | 75:$8.91747 |
| SN74BCT8373ADWE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 0 | 75:$8.91747 |
| SN74BCT8240ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 0 | 75:$8.91747 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1:$13.37000 10:$12.13300 25:$11.25000 100:$10.30750 250:$9.42400 500:$8.77610 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1:$13.37000 10:$12.13300 25:$11.25000 100:$10.30750 250:$9.42400 500:$8.77610 |
| SN74SSQEC32882ZALR | Texas Instruments | IC REGSTR BUFF 28-56BIT 176NFBGA | 0 | 1,000:$7.83400 2,000:$7.53900 5,000:$7.30400 10,000:$7.06800 |
| 類別: | 集成電路 (IC) |
|---|---|
| 邏輯類型: | 數字鎖相回路濾波器 |
| 電源電壓: | 4.75 V ~ 5.25 V |
| 位數: | - |
| 工作溫度: | 0°C ~ 70°C |
| 安裝類型: | 通孔 |
| 封裝/外殼: | 16-DIP（0.300"，7.62mm） |
| 供應商設備封裝: | 16-PDIP |
| 包裝: | 管件 |