| 元器件型號 | 廠商 | 描述 | 數量 | 價格 |
|---|---|---|---|---|
| SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 0 | 1,000:$6.54800 2,000:$6.30500 5,000:$6.06300 10,000:$5.96600 25,000:$5.82000 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 1,066 | 1:$9.75000 10:$8.77000 25:$7.97600 100:$7.21980 250:$6.61500 500:$6.04800 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 1,066 | 1:$9.75000 10:$8.77000 25:$7.97600 100:$7.21980 250:$6.61500 500:$6.04800 |
| SN74SSTEB32866ZWLR | Texas Instruments | IC BUFF CONFIG REG 25BIT 96BGA | 0 | 1,000:$5.10300 2,000:$4.91400 5,000:$4.72500 10,000:$4.64900 25,000:$4.53600 |
| 類別: | 集成電路 (IC) |
|---|---|
| 邏輯類型: | 掃描測試設備，帶寄存總線收發器 |
| 電源電壓: | 4.5 V ~ 5.5 V |
| 位數: | 8 |
| 工作溫度: | -40°C ~ 85°C |
| 安裝類型: | 表面貼裝 |
| 封裝/外殼: | 28-SOIC（0.295"，7.50mm 寬） |
| 供應商設備封裝: | 28-SOIC |
| 包裝: | 帶卷 (TR) |