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參數資料
| 型號： | E710-EDGE710 |
| 英文描述： | 500 MHz Pin Electronics Driver. Window Comparator. and Load |
| 中文描述： | 500兆赫引腳電子驅動器。窗口比較器。和負載 |
| 文件頁數： | 1/18頁 |
| 文件大小： | 186K |
| 代理商： | E710-EDGE710 |
HIGH-PERFORMANCE PRODUCTS – ATE
1
www.semtech.com
Edge710
500 MHz Pin Electronics Driver,
Window Comparator, and Load
Description
Features
Functional Block Diagram
Applications
Revision 2 / August 30, 2001
The Edge710 is a totally monolithic ATE pin electronics
solution manufactured in a high-performance
complementary bipolar process. In Automatic Test
Equipment (ATE) applications, the Edge710 incorporates
a driver, a load, and a window comparator suitable for
very fast bidirectional channels in VLSI, Mixed-Signal, and
Memory test systems.
The three-statable driver is capable of generating 9V swings
over a 12V range. In addition, 13V super voltage may be
obtained under certain operating conditions. Separate
rise and fall edge adjustments support both high speed
and low speed applications, and allow for superior rise
and fall time matching. An input power down mode allows
extremely low leakage current in HiZ.
The load supports programmable source and sink currents
of
± 35 mA over a 12V range, or it can be completely
disabled. The source current, sink current, and
commutating voltage are all independently set. In addition,
the load is configurable and may be used as a
programmable voltage clamp.
The window comparator spans a 12V common mode
range, tracks input signals with edge rates greater than 6
V/ns, and passes sub-ns pulses. An input power down
mode allows for extremely low leakage measurements.
The inclusion of all pin electronics building blocks into a
52 lead MQFP (10 mm body w/ internal heat spreader)
offers a highly integrated solution that is traditionally
implemented with multiple integrated circuits or discretes.
Fully Integrated Three-Statable Driver, Window
Comparator, and Dynamic Active Load
12V Driver, Load, Compare Range
13V Super Voltage Capable
± 35 mA Programmable Load
Comparator Input Tracking >6V/ns
Leakage (L+D+C) < 1
A (normal mode)
Leakage (L+D+C) < 25 nA (IPD mode)
Small footprint (52 pin MQFP)
VLSI Test Equipment
Mixed-Signal Test Equipment
Memory Testers (Bidirectional Channels)
ASIC Verifiers
BIAS
DVH
DHI
DHI*
DVR_EN
DVR_EN*
DVL
IPD_D
QA*
QA
PECL
IPD_C
QB
QB*
ISC_IN
VCM_IN
VCM_OUT_A
VCM_OUT_B
ISK_IN
LD_EN
LD_EN*
RADJ
DOUT
FADJ
CVA
VINP
CVB
BRIDGE_SC
LOAD
BRIDGE_SK
1K
1K
VCC
VEE
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