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參數(shù)資料
| 型號： | FQI17N08 |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | JFETs |
| 英文描述： | 80V N-Channel MOSFET |
| 中文描述： | 16.5 A, 80 V, 0.115 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-262 |
| 封裝： | I2PAK-3 |
| 文件頁數(shù)： | 4/9頁 |
| 文件大小： | 676K |
| 代理商： | FQI17N08 |
2002 Fairchild Semiconductor Corporation
F
Rev. B, August 2002
1 0
-5
1 0
-4
1 0
-3
1 0
-2
1 0
-1
1 0
0
1 0
1
1 0
-2
1 0
-1
1 0
0
※
N ote s :
1. Z
θ
2. D u ty F actor, D =t
1
/t
2
3. T
J M
- T
C
= P
D M
* Z
θ
(t) = 1.5
℃
/W M ax.
J C
(t)
sing le pu lse
D = 0.5
0 .02
0 .01
0 .2
0 .05
0 .1
Z
θ
J
(
t
1
, S q u a re W a ve P u ls e D u ra tio n [s e c ]
25
50
75
100
125
150
175
0
4
8
12
16
20
-
D
,
T
C
, Case Temperature [
℃
]
10
0
10
1
10
2
10
-1
10
0
10
1
10
2
DC
10 ms
1 ms
100
μ
s
Operation in This Area
is Limited by R
DS(on)
※
Notes :
1. T
C
= 25
2. T
J
= 175
3. Single Pulse
o
C
o
C
-
D
,
-V
DS
, Drain-Source Voltage [V]
-100
-50
0
50
100
150
200
0.0
0.5
1.0
1.5
2.0
2.5
※
Notes :
1. V
= -10 V
2. I
D
= -8.25 A
R
D
,
D
T
J
, Junction Temperature [
o
C]
-100
-50
0
50
100
150
200
0.8
0.9
1.0
1.1
1.2
※
Notes :
1. V
GS
= 0 V
2. I
D
= -250
μ
A
-
D
,
D
T
J
, Junction Temperature [
o
C]
Typical Characteristics
(Continued)
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs. Case Temperature
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
Figure 11. Transient Thermal Response Curve
t
1
P
DM
t
2
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| FQI17N40TU | 功能描述:MOSFET DISC BY MFG 2/02 RoHS:否 制造商:STMicroelectronics 晶體管極性:N-Channel 汲極/源極擊穿電壓:650 V 閘/源擊穿電壓:25 V 漏極連續(xù)電流:130 A 電阻汲極/源極 RDS（導(dǎo)通）:0.014 Ohms 配置:Single 最大工作溫度: 安裝風(fēng)格:Through Hole 封裝 / 箱體:Max247 封裝:Tube |
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