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參數資料
型號: FSA2267A
廠商: Fairchild Semiconductor Corporation
英文描述: 0.35ヘ Low-Voltage Dual-SPDT Analog Switch
中文描述: 0.35ヘ低電壓雙SPDT模擬開關
文件頁數: 4/16頁
文件大小: 1540K
代理商: FSA2267A
Ω
2005 Fairchild Semiconductor Corporation
FSA2267 / FSA2267A Rev. 1.0.3
www.fairchildsemi.com
4
ESD Protection
ESD Performance of the FSA2267/FSA2267A
FSA2267
HBM all pins 7.0kV
CDM all pins 1.0kV
FSA267A
HBM all pins 7.5kV
CDM all pins 1.0kV
Human Body Model
Figure 5 shows the schematic representation of the
Human Body Model ESD event. Figure 6 is the ideal
waveform representation of the Human Body Model. The
device is tested to JEDEC: JESD22-A114 Human Body
Model.
Charged Device Model
In manufacturing test and handling environments, a
more useful model is the Charged Device Model and the
FSA2267/FSA2267A has a very good ESD immunity to
this model. The device is tested to JEDEC: JESD22-
C101 Charged Device Model.
IEC 61000-4-2
The IEC 61000-4-2 standard covers ESD testing and
performance of finished equipment and evaluates the
equipment in its entirety for ESD immunity. Fairchild
Semiconductor has evaluated this device using the
IEC 6100-4-2 representative system model depicted in
Figure 7.
ESD values measured via the IEC 61000-4-2 evaluation
method are influenced by the specific board layout,
board size, and many other factors of the manufacturer’s
product application. Measured system ESD values can-
not be guaranteed by Fairchild Semiconductor to exactly
correlate to a manufacturer’s in-house testing due to
these application environment variables. Fairchild Semi-
conductor has been able to determine that, for ultra-por-
table applications, an enhanced ESD immunity, relative
to the IEC 61000-4-2 specification, can be achieved with
the inclusion of a 100
Ω
series resistor in the V
CC
supply
path to the analog switch (see Figure 8). Typical
improvements of between 3-6kV of ESD immunity (I/O to
GND) have been measured with the inclusion of the
resistor with the IEC 61000-4-2 representative model.
For more information on ESD testing methodologies,
please refer to:
AN-6019 Fairchild Analog Switch Products ESD Test
Methodology Overview
http://www.fairchildsemi.com/an/AN/AN-6019.pdf.
Additional ESD Test Conditions
For information regarding test methodologies and perfor-
mance levels, please contact Fairchild Semiconductor.
Figure 5. Human Body ESD Test Model
Figure 6. HBM Current Waveform
Figure 7. IEC 61000-4-2 ESD Test Model
Figure 8. ESD Immunity with 100
Ω
Resistor
1B
0
1B
1
2B
0
2B
1
1A
1S
2A
2S
ESD Event
100
Analog Switch Supply Rail
Ultra-portable Connector
V
CC
相關PDF資料
PDF描述
FSA2267AMUX 0.35ヘ Low-Voltage Dual-SPDT Analog Switch
FSA2267MUX 0.35ヘ Low-Voltage Dual-SPDT Analog Switch
FSA2267 0.35 ohm Low Voltage Dual SPDT Analog Switch
FSA2267L10X 0.35 ohm Low Voltage Dual SPDT Analog Switch
FSA2267AL10X 0.35 ohm Low Voltage Dual SPDT Analog Switch
相關代理商/技術參數
參數描述
FSA2267AL10X 功能描述:模擬開關 IC SWITCHES RoHS:否 制造商:Texas Instruments 開關數量:2 開關配置:SPDT 開啟電阻(最大值):0.1 Ohms 切換電壓(最大): 開啟時間(最大值): 關閉時間(最大值): 工作電源電壓:2.7 V to 4.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:DSBGA-16
FSA2267AMUX 功能描述:模擬開關 IC 0.35 Ohm LV Dual SPDT Analog Switch RoHS:否 制造商:Texas Instruments 開關數量:2 開關配置:SPDT 開啟電阻(最大值):0.1 Ohms 切換電壓(最大): 開啟時間(最大值): 關閉時間(最大值): 工作電源電壓:2.7 V to 4.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:DSBGA-16
FSA2267L10X 功能描述:模擬開關 IC 0.35 Ohm Low Voltage Dual SPDT Analog RoHS:否 制造商:Texas Instruments 開關數量:2 開關配置:SPDT 開啟電阻(最大值):0.1 Ohms 切換電壓(最大): 開啟時間(最大值): 關閉時間(最大值): 工作電源電壓:2.7 V to 4.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:DSBGA-16
FSA2267L10X_F113 功能描述:模擬開關 IC FINISHED GOOD RoHS:否 制造商:Texas Instruments 開關數量:2 開關配置:SPDT 開啟電阻(最大值):0.1 Ohms 切換電壓(最大): 開啟時間(最大值): 關閉時間(最大值): 工作電源電壓:2.7 V to 4.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:DSBGA-16
FSA2267MUX 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:0.35ヘ Low-Voltage Dual-SPDT Analog Switch
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