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參數(shù)資料
型號(hào): GP1A52LRJ00F
廠商: Sharp Microelectronics
文件頁數(shù): 7/12頁
文件大小: 0K
描述: PHOTOINTER OPIC SLOT 3.0MM PCB
產(chǎn)品變化通告: Internal Chip Change 04/May/2007
標(biāo)準(zhǔn)包裝: 100
系列: OPIC™
檢測(cè)距離: 0.118"(3mm)
檢測(cè)方法: 可傳導(dǎo)的
輸出配置: 上拉電阻,緩沖器
安裝類型: 通孔
電流 - 電源: 1.7mA
電源電壓: 4.5 V ~ 17 V
響應(yīng)時(shí)間: 1µs,0.05µs
封裝/外殼: PCB 安裝
產(chǎn)品目錄頁面: 2776 (CN2011-ZH PDF)
其它名稱: 425-1951-5
7
Sheet No.: D3-A04101EN
GP1A52LRJ00F
?SPAN class="pst GP1A52LRJ00F_2584176_4">Design Considerations
?/DIV>
Recommended operating conditions
Parameter
Symbol    MIN.
TYP.
MAX.
Unit
Output current
I
O


16
mA
Forward current
I
F
10

20
mA
Operating terperature
T
opr
0

70
?/DIV>
Notes about static electricity
Transisiter of detector side in bipolar con guration may be damaged by static electricity due to its minute
design.
When handing these devices, general countermeasure against static electricity should be taken to avoid
breakdown of devices or degradation of characteristics.
?/DIV>
Design guide
1) Prevention of detection error
To prevent photointerrupter from faulty operation caused by external light, do not set the detecting face to
the external light.
2) In order to stabilize power supply line, connect a by-pass capacitor of more than 0.01糉 between V
CC
 and
GND near the device.
3) Position of opaque board
Opaque board shall be installed at place 4mm or more from the top of elements.
(Example)
4mm or more
This product is not designed against irradiation and incorporates non-coherent IRED.
?/DIV>
Degradation
In general, the emission of the IRED used in photocouplers will degrade over time.
In the case of long term operation, please take the general IRED degradation (50% degradation over 5
years) into the design consideration.
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