
4
Spec Number
511003-883
Rise and Fall
Time
t
r
V
OUT
= 0 to +200mV, 10%
≤
t
r
≤
90%
7
25
-
50
ns
8A, 8B
125, -55
-
60
ns
t
f
V
OUT
= 0 to -200mV, 10%
≤
t
f
≤
90%
7
25
-
50
ns
8A, 8B
125, -55
-
60
ns
Overshoot
+OS
V
OUT
= 0 to +200mV
7
25
-
40
%
8A, 8B
125, -55
-
50
%
-OS
V
OUT
= 0 to -200mV
7
25
-
40
%
8A, 8B
125, -55
-
50
%
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: V
SUPPLY
=
±
15V, R
LOAD
= 2k
, C
LOAD
= 50pF, Unless Otherwise Specified.
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMP (
o
C)
MIN
MAX
UNITS
Differential Input
Resistance
R
IN
V
CM
= 0V
3
25
50
-
M
Full Power
Bandwidth
FPBW
V
PEAK
= 10V
3, 4
25
750
-
kHz
Minimum Closed
Loop Stable Gain
CLSG
R
L
= 2k
, C
L
= 50pF
3
-55 to 125
1
-
V/V
Quiescent Power
Consumption
PC
V
OUT
= 0V, I
OUT
= 0mA
3, 5
-55 to 125
-
195
mW
NOTES:
3. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
4. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2
π
V
PEAK
).
5. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)
1
Final Electrical Test Parameters
1 (Note 6), 2, 3, 4, 5, 6, 7, 8A, 8B
Group A Test Requirements
1, 2, 3, 4, 5, 6, 7, 8A, 8B
Groups C and D Endpoints
1
NOTE:
6. PDA applies to Subgroup 1 only.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at: V
SUPPLY
=
±
15V, R
SOURCE
= 50
, R
LOAD
= 2k
, C
LOAD
= 50pF, A
VCL
= +1V/V, Unless Otherwise Specified.
PARAMETER
SYMBOL
CONDITIONS
GROUP A
SUBGROUPS
TEMP (
o
C)
MIN
MAX
UNITS
HA-2510/883