- 您現在的位置：買賣IC網 > PDF目錄385356 > HCTS541MS (Intersil Corporation) Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State PDF資料下載
參數資料
| 型號： | HCTS541MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State |
| 中文描述： | 輻射加固非反相八路緩沖器/線路驅動器，三態 |
| 文件頁數： | 6/10頁 |
| 文件大?。?/td> | 126K |
| 代理商： | HCTS541MS |
687
Specifications HCTS541MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternated Group A Inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE: 1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
11 - 18
1 - 10, 19
-
20
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
11 - 18
10
-
1 - 9, 19, 20
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
10
11 - 18
20
1, 19
2 - 9
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
11 - 18
10
1 - 9, 19, 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518630
相關PDF資料 |
PDF描述 |
|---|---|
| HCTS541DMSR | Quadruple 2-Input Positive-NOR Gates 14-CFP -55 to 125 |
| HCTS541K | Hex Inverters 20-LCCC -55 to 125 |
| HCTS541HMSR | Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State |
| HCTS541KMSR | Radiation Hardened Non-Inverting Octal Buffer/Line Driver, Three-State |
| HCTS75D | Quadruple Bus Buffer Gates With 3- State Outputs 14-CFP -55 to 125 |
相關代理商/技術參數 |
參數描述 |
|---|---|
| HCTS574D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered |
| HCTS574DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered |
| HCTS574HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered |
| HCTS574K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered |
| HCTS574KMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered |
發布緊急采購，3分鐘左右您將得到回復。