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參數資料
| 型號： | HFX7LB-FREQ-(T) |
| 廠商： | PERICOM SEMICONDUCTOR CORP |
| 元件分類： | 晶體 |
| 英文描述： | QUARTZ CRYSTAL RESONATOR, 30 MHz - 250 MHz |
| 文件頁數： | 1/2頁 |
| 文件大小： | 135K |
| 代理商： | HFX7LB-FREQ-(T) |
SaRonix
Quartz Crystal
Technical Data
HFX7 Series
SaRonix
DS-127
REV B
141 Jefferson Drive Menlo Park, CA 94025 USA 650-470-7700 800-227-8974 Fax 650-462-9894
High Frequency Fundamental AT Cut, SMD
Frequency Range:
Frequency Calibration
Tolerance @ 25°C:
Load Capacitance:
±25, ±50, ±100 ppm. Others available, contact SaRonix
4 pF to Series
30 MHz to 250 MHz Fundamental
Description
ACTUAL SIZE
The HFX7 Series is a very high fre-
quency miniature AT-cut resonator
housed in a standard 5x7 mm ceramic
package. The parts exhibit excellent ag-
ing and stability characteristics. Tab-
Mesa Technology TmTTM, proprietary
to Saronix, is used to achieve funda-
mental resonators to 250 MHz.
Applications & Features
Telecommunications
Wireless RF Applications
Video, graphics
VCXO's
Low jitter, high frequency oscillators
Ultra low power oscillators and
transmitters
Micro-miniature modules
Small seam welded package
AT cut
Available on tape & reel; 16mm tape,
1000pcs per reel
Temperature Stability:
±10, ±25, ±50, ±100 ppm over -20 to +70°C typical.
Others available, contact SaRonix
Drive Level:
25W correlation, 500W max
Quality Factor (Q):
see Typical Crystal Parameters, Chart 1
Motional Capacitance (C1):
Shunt Capacitance (C0):
Solder Reflow Guide
Preheat 183 ±10°C
4°C/sec max
Reflow 240 max
Cooling
4°C/sec max
1 – 2 minutes
Time
10 sec max
see Typical Crystal Parameters, Chart 2
see Typical Crystal Parameters, Chart 3
150
200
250
Temperature
–
°C
Effective Series Resistance:
see Typical Crystal Parameters, Chart 4
Storage Temperature:
-55 to +125°C
Aging First Year:
±5 ppm
Mechanical:
Shock:
Solderability:
Vibration:
Solvent Resistance:
Resistance to Soldering Heat:
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 2003
MIL-STD-883, Method 2007, Condition A
MIL-STD-202, Method 215
MIL-STD-202, Method 210, Condition I or J
Environmental:
Gross Leak Test:
Fine Leak Test:
Thermal Shock:
Moisture Resistance:
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 1014, Condition A2
<5 x 10-8 ATM cc/sec
MIL-STD-883, Method 1011, Condition A
MIL-STD-883, Method 1004
Type
HFX7 x x – 120.0000 – xx
(T)
Load Capacitance (pF)
(Blank = series resonant)
Frequency (MHz)
Frequency Calibration
Temperature Stability
AA = ±10 ppm -20°C to +70°C
A = ±25 ppm -20°C to +70°C
B = ±50 ppm -20°C to +70°C
C = ±100 ppm -20°C to +70°C
K =
L =
M =
±25 ppm
±50 ppm
±100 ppm
Part Numbering Guide
(T) = Tape & Reel
full reel increments only
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