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參數資料
| 型號： | HI-883 |
| 廠商： | Intersil Corporation |
| 英文描述： | The HI-200/883 is a monolithic device comprising two independently selectable SPST switchers which feature fast switching speeds |
| 中文描述： | 該HI-200/883是單片器件包括兩個獨立選擇聚苯乙烯交換機的功能，快速的開關速度 |
| 文件頁數： | 3/11頁 |
| 文件大小： | 315K |
| 代理商： | HI-883 |
3
Supply Current
-I
CC
All Channels V
A
= 0V
1
25
-2.0
-
μA
2, 3
-55 to 125
-2.0
-
μA
All Channels V
A
= 3V
1
25
-2.0
-
μA
2, 3
-55 to 125
-2.0
-
μA
TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V, Unless Otherwise Specified.
D.C. PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUBGROUPS
TEMPERATURE
(
o
C)
MIN
MAX
UNITS
TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUB-
GROUPS
TEMPERATURE
(
o
C)
MIN
MAX
UNITS
Turn “ON” Time
t
ON
C
L
= 35pF,
R
L
= 1k
9
25
-
500
ns
10, 11
55 to 125
-
800
ns
Turn “OFF” Time
t
OFF
C
L
= 33pF,
R
L
= 1k
9
25
-
500
ns
10, 11
55 to 125
-
650
ns
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V
PARAMETERS
SYMBOL
CONDITIONS
NOTE
TEMPERATURE
(
o
C)
MIN
MAX
UNITS
Address Capacitance
C
A
f = 1MHz, V
AL
= 0V
f = 1MHz, V
AH
= 5V,
Measured Source to GND
1
25
-
20
pF
Switches Input
Capacitance
C
S (OFF)
1
25
-
20
pF
Switch Output Capacitance
C
D (OFF)
f = 1MHz, V
AH
= 5V,
Measured Output to Ground
1
25
-
20
pF
C
D (ON)
f = 1MHz, V
AL
= 0V,
Measured Output to Ground
1
25
-
30
pF
Drain to Source
Capacitance
C
DS
f = 1MHz, V
AH
= 5V
1
25
-
2.0
pF
Off Isolation
V
ISO
f = 200kHz, V
A
= 2.4, R
L
= 1K,
V
GEN
= 1V
P-P,
C
L
= 10pF
f = 200kHz, V
A
= 2.\4, R
L
= 1K,
V
GEN
= 1V
P-P,
C
L
= 10pF
f = 200kHz, V
A
= 0 to 4V,
C
L
= 0.01μF
1
25
55
-
dB
Cross Talk
V
CT
1
25
60
-
dB
Charge Transfer Error
V
CTE
1
25
-10
10
mV
NOTE:
1. Parameters listed in Table 2 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS
(Tables 1 and 2)
Interim Electrical Parameters (Pre Burn-in)
1
Final Electrical Test Parameters
1 (Note 2), 2, 3, 9, 10, 11
Group A Test Requirements
1, 2, 3, 9, 10, 11
Groups C & D Endpoints
1
NOTE:
2. PDA applies to Subgroup 1 only.
HI-200/883
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