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參數(shù)資料
型號: ISO213
元件分類: 測量放大器
英文描述: Precision Instrumentation Amplifier
中文描述: 精密儀表放大器
文件頁數(shù): 3/13頁
文件大小: 131K
代理商: ISO213
3
ISO213
ABSOLUTE MAXIMUM RATINGS
Supply Voltage Without Damage ......................................................... 18V
Continuous Isolation Voltage Across Barrier:............................ 2500Vrms
Storage Temperature Range............................................ –25
°
C to 100
°
C
Lead Temperature (soldering, 10s) ............................................... +300
°
C
Amplifier Output Short-Circuit Duration ............... Continuous to Common
Output Voltage to Com 2 ...............................................................
±
V
CC
/2
MODEL
PACKAGE
RANGE
RATING 1 MIN
ISO213P
38-Pin Plastic ZIP
–25
°
C to +85
°
C
2500Vrms
Bottom View
Com 1 2
F
B
4
+V
SS
6
GS
A
8
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
1 +V
IN
3 –V
IN
5 –V
SS
7 GS
B
31 +V
CC
35 Clock In
37 ACom 2
PIN CONFIGURATION
PACKAGE INFORMATION
PACKAGE DRAWING
NUMBER
(1)
MODEL
PACKAGE
ISO213P
38-Pin Plastic ZIP
326
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix D of Burr-Brown IC Data Book.
ORDERING INFORMATION
OPERATING
TEMPERATURE
ISOLATION
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
Com 2 32
Clock Out 34
V
OUT
38
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