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參數資料
| 型號： | LMV115 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | GSM Baseband 30MHz 2.8V Oscillator Buffer |
| 中文描述： | GSM基帶30MHz的2.8V的振蕩器緩沖 |
| 文件頁數： | 3/13頁 |
| 文件大小： | 475K |
| 代理商： | LMV115 |
2.8V Electrical Characteristics
(Continued)
Unless otherwise specified, all limits guaranteed for T
J
= 25C, V
+
= 2.8V, V
= 0V, V
= V
+
/2, shutdown = 0.0V, and R
L
=
50k
to V
+
/2, C
L
= 5pF to V
+
/2 and C
COUPLING
= 1nF.
Boldface
limits apply at the temperature extremes.
Symbol
Z
IN
Parameter
Conditions
Min
(Note 9)
Typ
(Note 8)
2.38
2.47
Max
(Note 9)
Units
Input Impedance
f = 25MHz; Shutdown = 2.8V
f = 25MHz; Shutdown = 0V
R
L
= 50k
to V
+
/2
k
V
O
Output Swing Positive
1.90
1.65
2.16
V
Output Swing Negative
R
L
= 50k
to V
+
/2
1.05
1.35
1.30
I
O
Linear Output Current
No Load; V
OUT
= V
+
1.1V
(Sourcing)
No Load; V
OUT
= V
+ 1.1V
(Sinking)
No Load; Sourcing to V
+
/2
90
35
100
50
90
35
100
50
206
μA
205
I
SC
Output Short-Circuit Current
(Note 5)
186
μA
No Load; Sinking from V
+
/2
191
R
ON
Switch in ON Position
21
40
45
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.
Note 2:
Human Body Model (HBM) is 1.5k
in series with 100pF.
Note 3:
Machine Model, 0
in series with 200pF.
Note 4:
Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the
maximum allowed junction temperature of 150C
Note 5:
Infinite Duration; Short circuit test is a momentary test. See next note.
Note 6:
The maximum power dissipation is a function of T
,
θ
, and T
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
-T
A
) /
θ
JA
. All numbers apply for packages soldered directly onto a PC board.
Note 7:
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device such that T
J
= T
A
. There is no guarantee of parametric performance as indicated in the electrical tables under conditions of internal self-heating where
T
J
>
T
A
. See Applications section for information on temperature de-rating of this device.
Note 8:
Typical Values represent the most likely parametric norm.
Note 9:
All limits are guaranteed by testing or statistical analysis.
Note 10:
Positive current corresponds to current flowing into the device.
Note 11:
Slew rate is the average of the positive and negative slew rate.
Note 12:
Average Temperature Coefficient is determined by dividing the change in a parameter at temperature extremes by the total temperature change.
L
www.national.com
3
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