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參數資料
| 型號： | MAX823 |
| 廠商： | Maxim Integrated Products, Inc. |
| 英文描述： | 8-Bit Parallel-Out Serial Shift Registers 14-CFP -55 to 125 |
| 中文描述： | 5引腳、微處理器監控電路，帶有看門狗定時器及手動復位 |
| 文件頁數： | 4/9頁 |
| 文件大小： | 135K |
| 代理商： | MAX823 |
V. Quality Assurance Information
A. Quality Assurance Contacts:
B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135
°
C biased (static) life test are shown in
Table 1
. Using these results, the Failure
Rate (
λ
) is calculated as follows:
λ
= 1 = 1.83 (Chi square value for MTTF upper limit)
MTTF
192 x 4389 x 320 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
λ
= 3.39 x 10
-9
λ
= 3.39 F.I.T. (60% confidence level @ 25
°
C)
This low failure rate represents data collected from Maxim’s reliability monitor program. In addition to
routine production Burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects
it to an extended Burn-In prior to shipment to ensure its reliability. The reliability control level for each lot to be
shipped as standard product is 59 F.I.T. at a 60% confidence level, which equates to 3 failures in an 80 piece
sample. Maxim performs failure analysis on any lot that exceeds this reliability control level. Attached Burn-In
Schematic (Spec. # 06-5033) shows the static Burn-In circuit. Maxim also performs quarterly 1000 hour life test
monitors. This data is published in the Product Reliability Report (
RR-1M
).
B. Moisture Resistance Tests
Maxim pulls pressure pot samples from every assembly process three times per week. Each lot sample
must meet an LTPD = 20 or less before shipment as standard product. Additionally, the industry standard
85
°
C/85%RH testing is done per generic device/package family once a quarter.
C. E.S.D. and Latch-Up Testing
The MS04-3 die type has been found to have all pins able to withstand a transient pulse of
±
1500V per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of
±
250mA.
Jim Pedicord (Manager, Reliability Operations)
Bryan Preeshl (Executive Director
)
Kenneth Huening (Vice President)
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