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參數資料
| 型號： | MC74AC10 |
| 廠商： | ON SEMICONDUCTOR |
| 英文描述： | TRIPLE 3-INPUT NAND GATE |
| 中文描述： | 三重3輸入與非門 |
| 文件頁數： | 2/5頁 |
| 文件大小： | 128K |
| 代理商： | MC74AC10 |
MC74AC10 MC74ACT10
5-2
FACT DATA
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
′
AC
2.0
5.0
6.0
V
′
ACT
4.5
5.0
5.5
Vin, Vout
DC Input Voltage, Output Voltage (Ref. to GND)
0
VCC
V
′
AC Devices except Schmitt Inputs
VCC @ 3.0 V
VCC @ 4.5 V
150
tr, tf
Input Rise and Fall Time (Note 1)
40
ns/V
VCC @ 5.5 V
VCC @ 4.5 V
VCC @ 5.5 V
25
tr, tf
Input Rise and Fall Time (Note 2)
′
ACT Devices except Schmitt Inputs
10
ns/V
8.0
TJ
TA
IOH
IOL
Junction Temperature (PDIP)
140
°
C
Operating Ambient Temperature Range
–40
25
85
°
C
Output Current — High
–24
mA
Output Current — Low
24
mA
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
Symbol
Parameter
(V)
74AC
74AC
Unit
Conditions
VCC
TA = +25
°
C
TA =
–40
°
C to +85
°
C
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
2.1
3.15
3.85
2.1
3.15
3.85
VOUT = 0.1 V
or VCC – 0.1 V
V
VIL
Maximum Low Level
Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
0.9
1.35
1.65
0.9
1.35
1.65
VOUT = 0.1 V
or VCC – 0.1 V
V
VOH
Minimum High Level
Output Voltage
3.0
4.5
5.5
2.99
4.49
5.49
2.9
4.4
5.4
2.9
4.4
5.4
IOUT = –50
μ
A
V
V
*VIN = VIL or VIH
3.0
4.5
5.5
2.56
3.86
4.86
2.46
3.76
4.76
–12 mA
–24 mA
–24 mA
IOH
VOL
Maximum Low Level
Output Voltage
3.0
4.5
5.5
0.002
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
IOUT = 50
μ
A
V
V
*VIN = VIL or VIH
3.0
4.5
5.5
0.36
0.36
0.36
0.44
0.44
0.44
12 mA
24 mA
24 mA
IOL
IIN
Maximum Input
Leakage Current
5.5
±
0.1
±
1.0
μ
A
VI = VCC, GND
IOLD
Minimum Dynamic
Output Current
5.5
75
mA
VOLD = 1.65 V Max
IOHD
5.5
–75
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
4.0
40
μ
A
VIN = VCC or GND
* All outputs loaded; thresholds on input associated with output under test.
Maximum test duration 2.0 ms, one output loaded at a time.
Note: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
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