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參數(shù)資料
| 型號： | MN100324 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Hex TTL-to-ECL Translator(六TTL-ECL電平轉(zhuǎn)換器) |
| 中文描述： | 十六進(jìn)制的TTL到ECL翻譯（六的TTL - ECL電平轉(zhuǎn)換器） |
| 文件頁數(shù)： | 5/8頁 |
| 文件大?。?/td> | 79K |
| 代理商： | MN100324 |
MN100324-X REV 2A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
Vee Range: -4.2V to -5.7V, LOADING: 50 Ohms To -2.0V, VCC=VCCA=GND, VTTL Range: +4.5V to +5.5V
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpLH/tpHL
Propagation Delay
VEE=-4.2/-5.7V VTTL=4.5/5.5V
2, 4 Dn or E
to Qn
0.5
2.9
ns
9
2, 4 Dn or E
to Qn
0.3
3.3
ns
10
2, 4 Dn or E
to Qn
0.5
3.0
ns
11
tTLH/tTHL
Transistion Time
VEE=-4.2/-5.7V, VTTL=4.5/5.5V
6
Qn
0.45
1.8
ns
9, 10
6
Qn
0.35
1.8
ns
11
Note 1:
Screen tested 100% on each device at -55 C, +25 C and +125 C temp., subgroups 1, 2,
3, 7 & 8.
For QB devices, screen tested 100% on each device at +25C temperature only, subgroup
A9. For QMLV devices, screen tested 100% on each device at +25C, +125C & -55C
temperature, subgroups A9, 10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, +125 C & -55 C temp.,
subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, subgroup A9, and at
+125 C & -55 C temp., subgroups A10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C temp. only, subgroup
A9.
Not tested at +25 C, +125 C & -55 C temp. (DESIGN CHARACTERIZATION DATA).
Guaranteed by applying specified input condition and testing VOH/VOL.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
5
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