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參數資料
| 型號： | MNDM54LS20 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | DUAL 4-INPUT NAND GATE |
| 中文描述： | 雙4輸入與非門 |
| 文件頁數： | 1/6頁 |
| 文件大小： | 12K |
| 代理商： | MNDM54LS20 |
Original Creation Date: 04/22/98
Last Update Date: 06/16/98
Last Major Revision Date: 04/22/98
MNDM54LS20-X REV 1A0
MICROCIRCUIT DATA SHEET
DUAL 4-INPUT NAND GATE
General Description
This device contains two independent gates, each of which performs the logic NAND
function.
NS Part Numbers
DM54LS20E/883
DM54LS20J/883
DM54LS20W/883
Industry Part Number
54LS20
Prime Die
L020
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
1
2
3
4
5
6
7
8A
8B
9
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11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
+25
+125
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1
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| MNDM54LS20-X | DUAL 4-INPUT NAND GATE |
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| MNDS26F32MWR-QML | QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
| MNDS26F32M-X-RH | QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
| MNDS26F32MER-QML | QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
相關代理商/技術參數 |
參數描述 |
|---|---|
| MNDM54LS20-X | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:DUAL 4-INPUT NAND GATE |
| MNDM54LS502-X | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:8 - BIT SUCCESSIVE APPROXIMATION REGISTER |
| MNDP83950B-VQB | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:REPEATER INTERFACE CONTROLLER |
| MNDS26C31M-X | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER |
| MNDS26F32ME/883 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
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