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參數資料
型號: NSI45090JDT4G
廠商: ON Semiconductor
文件頁數: 3/8頁
文件大小: 158K
描述: 90MA ADJUSTABLE CURRENT REG DPAK
標準包裝: 1
系列: *
功能: *
檢測方法: *
精確度: *
輸入電壓: *
電流 - 輸出: *
工作溫度: *
安裝類型: 表面貼裝
封裝/外殼: TO-252-3,DPak(2 引線+接片),SC-63
供應商設備封裝: DPAK-3
包裝: 標準包裝
其它名稱: NSI45090JDT4GOSDKR
NSI45090JDT4G
http://onsemi.com
3
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
Total Device Dissipation (Note 5) T
A
 = 25癈
 Derate above 25癈
P
D
1771
14.16
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 5)
R
?/DIV>
JA
70.6
癈/W
Thermal Reference, JunctiontoLead 4 (Note 5)
R
?/DIV>
JL4
6.8
癈/W
Total Device Dissipation (Note 6) T
A
 = 25癈
 Derate above 25癈
P
D
2083
16.67
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 6)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JA
60
癈/W
Thermal Reference, JunctiontoLead 4 (Note 6)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JL4
6.3
癈/W
Total Device Dissipation (Note 7) T
A
 = 25癈
 Derate above 25癈
P
D
2080
16.64
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 7)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JA
60.1
癈/W
Thermal Reference, JunctiontoLead 4 (Note 7)
R
?/DIV>
JL4
6.5
癈/W
Total Device Dissipation (Note 8) T
A
 = 25癈
 Derate above 25癈
P
D
2441
19.53
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 8)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JA
51.2
癈/W
Thermal Reference, JunctiontoLead 4 (Note 8)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JL4
5.9
癈/W
Total Device Dissipation (Note 9) T
A
 = 25癈
 Derate above 25癈
P
D
2309
18.47
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 9)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JA
54.1
癈/W
Thermal Reference, JunctiontoLead 4 (Note 9)
R
?/DIV>
JL4
6.2
癈/W
Total Device Dissipation (Note 10) T
A
 = 25癈
 Derate above 25癈
P
D
2713
21.71
mW
mW/癈
Thermal Resistance, JunctiontoAmbient (Note 10)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JA
46.1
癈/W
Thermal Reference, JunctiontoLead 4 (Note 10)
R
?SPAN class="pst NSI45090JDT4G_2644750_5">JL4
5.7
癈/W
Junction and Storage Temperature Range
T
J
, T
stg
55 to +175
NOTE: Lead measurements are made by noncontact methods such as IR with treated surface to increase emissivity to 0.9.
Lead temperature measurement by attaching a T/C may yield values as high as 30% higher 癈/W values based upon empirical
measurements and method of attachment.
5.  FR4 @ 300 mm
2
, 1 oz. copper traces, still air.
6.  FR4 @ 300 mm
2
, 2 oz. copper traces, still air.
7.  FR4 @ 500 mm
2
, 1 oz. copper traces, still air.
8.  FR4 @ 500 mm
2
, 2 oz. copper traces, still air.
9.  FR4 @ 700 mm
2
, 1 oz. copper traces, still air.
10.FR4 @ 700 mm
2
, 2 oz. copper traces, still air.
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