
1/8
QRFL9806
QUALIFICATION REPORT
M29F102 and M29F105 T6-U20:
1 Mbit (x16) Single Supply Flash Memory
INTRODUCTION
The M29F102 and M29F105 are a 1 Mbit Single Supply (5V) Flash memories organized as 64 KWord of
16 bits each. The M29F102 is offered in PLCC44 and TSOP40 packages; the M29F105 is offered in
TSOP40 package. The M29F105 is thesame die of the M29F102, 90
°
clockwide turned.They can be pro-
grammed and erased in-system or in standard EPROM programmers.
The M29F102 and M29F105 are manufactured with the STMicroelectronics advanced CMOS 0.6 micron
T6-U20 (-20% upgrade) process, especially developed for Flash memory products. The memory features
a fast access time, low power consumption in all operations (Standby, Read, Erase and Program)and an
endurance of 100,000 Program/Erase cycles per block.
The qualification tests of this program have been performed on devices assembled with the following
packages: PLCC44 and TSOP40 (10 x 14mm).
Qualification Report History
– March 1998: Catania M5 Diffusion Line
ST recognises that the quality of a productmust be built-in during the design, material procurement, ma-
nufacturing and testing. Also that the reliability must be demonstrated before theproduct is releasedto full
mass production. The qualification of new products and the certification of new processes is a rigorous
task undertaken by Quality andReliability professionals, to ensure stableproducts and processescapable
of fully meeting customer requirements.
A key step of this activity is the Design Review where we assure that,
– adequate and realistic product specifications have been developed;
– design and layout rules, as documented in the Design Rules Manual, have been respected;
– critical performance parameters and process variables have been identified;
– previously untested design techniques or manufacturing processes are recognised;
– manufacturability concernsare identified;
– comprehensive and efficient qualification programs are defined.
Product Qualification is made on all new products and on new packages. Qualification is also remade on
existing products when there are major changes to the design or manufacturing. The tests performed are
tailored to the parameters affected by the major change or the combinations of new die or new package
to be evaluated.
The results of the testsfor this Flash memory are on the attached pages of this qualification report.
Director of
Memory Products Group
Quality Control & Reliability
AttilioPANCHIERI
March 1998