- 您現在的位置：買賣IC網 > PDF目錄98078 > SCAN18374TFMQB (NATIONAL SEMICONDUCTOR CORP) SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 PDF資料下載
參數資料
| 型號： | SCAN18374TFMQB |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 總線收發器 |
| 英文描述： | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
| 文件頁數： | 1/12頁 |
| 文件大小： | 24K |
| 代理商： | SCAN18374TFMQB |
Original Creation Date: 10/23/98
Last Update Date: 12/11/98
Last Major Revision Date:
MNSCAN18374T-X REV 1A0
MICROCIRCUIT DATA SHEET
SERIALLY CONTROLLED ACCESS NETWORK D FLIP-FLOP WITH
TRI-STATE OUTPUTS
General Description
The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type
inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control
signals.
This device is compliant with IEEE 1149.1 Standard Test Access Port and
BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic
and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode
Select (TMS), and Test Clock (TCK).
NS Part Numbers
SCAN18374TFMQB
Industry Part Number
SCAN18374T
Prime Die
YJ374
Controlling Document
5962-93207
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
相關PDF資料 |
PDF描述 |
|---|---|
| SCAN18374TMDA | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, UUC56 |
| SCAN18374TFM | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
| SCAN18540TFMQB | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CDFP56 |
| SCAN18540TSSCX | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO56 |
| SCAN18541TFMQB | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
相關代理商/技術參數 |
參數描述 |
|---|---|
| SCAN18374TFMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCAN18374TSSC | 功能描述:觸發器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SCAN18374TSSCX | 功能描述:觸發器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SCAN1837TSSC | 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:Transparent Latch with 3-STATE Outputs |
| SCAN18540_YDB3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
發布緊急采購，3分鐘左右您將得到回復。