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| 型號： | SN54ALS157AJ |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 編、解碼器及復用、解復用 |
| 英文描述： | ALS SERIES, QUAD 2 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, CDIP16 |
| 封裝： | 0.300 INCH, CERAMIC, DIP-16 |
| 文件頁數(shù)： | 1/22頁 |
| 文件大?。?/td> | 764K |
| 代理商： | SN54ALS157AJ |
SN54ALS157A, SN54ALS158
SN74ALS157A, SN74ALS158, SN74AS157, SN74AS158
QUADRUPLE 1OF2 DATA SELECTORS/MULTIPLEXERS
SDAS081C APRIL 1982 REVISED DECEMBER 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Buffered Inputs and Outputs
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These
data
selectors/multiplexers
contain
inverters and drivers to supply full data selection
to the four output gates. A separate strobe (G)
input is provided. A 4-bit word is selected from one
of two sources and is routed to the four outputs.
The
′ALS157A and SN74AS157 present true
data. The
′ALS158 and SN74AS158 present
inverted data to minimize propagation delay time.
The
SN54ALS157A
and
SN54ALS158
are
characterized for operation over the full military
temperature range of 55
°C to 125°C. The
SN74ALS157A, SN74ALS158, SN74AS157, and
SN74AS158 are characterized for operation from
0
°C to 70°C.
FUNCTION TABLE
INPUTS
OUTPUT Y
G
A /B
DATA
′ALS157A
′ALS158
G
A /B
A
B
ALS157A
SN74AS157
ALS158
SN74AS158
H
X
L
H
L
LL
XL
H
L
LH
XH
L
HX
LL
H
L
H
X
H
L
SN54ALS157A, SN54ALS158 ...J PACKAGE
SN74ALS157A, SN74ALS158,
SN74AS157, SN74AS158 ... D OR N PACKAGE
(TOP VIEW)
32 1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
4B
NC
4Y
3A
1B
1Y
NC
2A
2B
SN54ALS157A, SN54ALS158 . . . FK PACKAGE
(TOP VIEW)
1A
A/B
NC
3Y
3B
G
2Y
GND
NC
V
CC
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
A /B
1A
1B
1Y
2A
2B
2Y
GND
VCC
G
4A
4B
4Y
3A
3B
3Y
NC No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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