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參數資料
| 型號： | SN74ACT8999DWR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28 |
| 封裝： | PLASTIC, SOIC-28 |
| 文件頁數： | 1/29頁 |
| 文件大小： | 430K |
| 代理商： | SN74ACT8999DWR |
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SN54ACT8999, SN74ACT8999
SCANPATH SELECTORS WITH 8BIT BIDIRECTIONAL DATA BUSES
SCANCONTROLLED IEEE STD 1149.1 (JTAG) TAP MULTIPLEXERS
SCAS158D JUNE 1990 REVISED DECEMBER 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
D Members of theTexas Instruments
SCOPE
Family of Testability Products
D Compatible With the IEEE Standard 1149.1
(JTAG) Serial Test Bus
D Allow Partitioning of System Scan Paths
D Can Be Cascaded Horizontally or Vertically
D Select One of Four Secondary Scan Paths
to Be Included in a Primary Scan Path
D Provide Communication Between Primary
and Remote Test Bus Controllers
D Include 8-Bit Programmable Binary Counter
to Count or Initiate Interrupt Signals
D Include 8-Bit Identification Bus for Scan
Path Identification
D Inputs Are TTL Compatible
D EPIC (Enhanced-Performance Implanted
CMOS) 1-
m Process
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs
description
The ’ACT8999 are members of the Texas
Instruments
SCOPE
testability integrated-
circuit family. This family of components facilitates
testing of complex circuit-board assemblies.
The ’ACT8999 enhance the scan capability of TI’s
SCOPE
family by allowing augmentation of a
system’s primary scan path with secondary scan
paths (SSPs), which can be individually selected
by the ’ACT8999 for inclusion in the primary scan
path. The device also provides buffering of test
signals to reduce the need for external logic.
By loading the proper values into the instruction register and data registers, the user can select one of four
secondary scan paths. This has the effect of shortening the scan path to allow maximum test throughput when
an individual subsystem (board or box) is to be tested. Any of the device’s six data registers or the instruction
register can be placed in the device’s scan path, i.e., placed between test data input (TDI) and test data output
(TDO) for subsequent shift and scan operations.
All operations of the device except counting are synchronous to the test clock (TCK). The 8-bit programmable
up/down counter can be used to count transitions on the device condition input (DCI) and output interrupt signals
via the device condition output (DCO). The device can be configured to count on either the rising or falling edge
of DCI.
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DTDI
OTMS
DCO
MCO
DTDO
DTCK
GND
DTMS1
DTMS2
DTMS3
DTMS4
DTRST
TDO
TMS
DCI
MCI
ID1
ID2
ID3
ID4
ID5
VCC
ID6
ID7
ID8
TRST
TDI
TCK
SN54ACT8999 ...JT PACKAGE
SN74ACT8999 . . . DW OR NT PACKAGE
(TOP VIEW)
32 1
13 14
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ID8
TRST
TDI
TCK
TMS
TDO
DTRST
ID1
MCI
DCI
DTDI
OTMS
DCO
MCO
4
15 16 17 18
DTCK
GND
D
TMS1
D
TMS2
D
TMS3
D
TMS4
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DTDO
ID2
ID3
ID4
ID5
V
ID6
ID7
CC
SN54ACT8999 . . . FK PACKAGE
(TOP VIEW)
Copyright
1996, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
SCOPE and EPIC are trademarks of Texas Instruments Incorporated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MILPRF38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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| SN74AHC00D | 功能描述:邏輯門 Quad 2 Input RoHS:否 制造商:Texas Instruments 產品:OR 邏輯系列:LVC 柵極數量:2 線路數量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| SN74AHC00DBR | 功能描述:邏輯門 Quad 2-In Pos NAND RoHS:否 制造商:Texas Instruments 產品:OR 邏輯系列:LVC 柵極數量:2 線路數量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| SN74AHC00DBRE4 | 功能描述:邏輯門 Quadruple 2-Input Positive-NAND gates RoHS:否 制造商:Texas Instruments 產品:OR 邏輯系列:LVC 柵極數量:2 線路數量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| SN74AHC00DBRG4 | 功能描述:邏輯門 Quad 2 Input Pos NAND Gates RoHS:否 制造商:Texas Instruments 產品:OR 邏輯系列:LVC 柵極數量:2 線路數量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
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