
SN54AC10, SN74AC10
TRIPLE 3INPUT POSITIVENAND GATES
SCAS529D AUGUST 1995 REVISED OCTOBER 2003
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D 2-V to 6-V VCC Operation
D Inputs Accept Voltages to 6 V
D Max tpd of 6.5 ns at 5 V
SN54AC10 ... J OR W PACKAGE
SN74AC10 ... D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
2A
2B
2C
2Y
GND
VCC
1C
1Y
3A
3B
3C
3Y
32
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
1Y
NC
3A
NC
3B
2A
NC
2B
NC
2C
SN54AC10 . . . FK PACKAGE
(TOP VIEW)
1B
1A
NC
3Y
3C
V
1C
2Y
GND
NC
NC No internal connection
CC
description/ordering information
The ’AC10 devices contain three independent 3-input NAND gates. The devices perform the Boolean function
Y = A
B C or Y = A + B + C in positive logic.
ORDERING INFORMATION
TA
PACKAGE
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP N
Tube
SN74AC10N
SOIC D
Tube
SN74AC10D
AC10
SOIC D
Tape and reel
SN74AC10DR
AC10
40
°C to 85°C
SOP NS
Tape and reel
SN74AC10NSR
AC10
40 C to 85 C
SSOP DB
Tape and reel
SN74AC10DBR
AC10
TSSOP PW
Tube
SN74AC10PW
AC10
TSSOP PW
Tape and reel
SN74AC10PWR
AC10
CDIP J
Tube
SNJ54AC10J
55
°C to 125°C
CFP W
Tube
SNJ54AC10W
55 C to 125 C
LCCC FK
Tube
SNJ54AC10FK
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
OUTPUT
Y
H
L
XX
H
X
LX
H
X
L
H
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
2003, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MILPRF38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.