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參數資料
| 型號： | THS1230IPW |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | ADC |
| 英文描述： | 1-CH 12-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO28 |
| 封裝： | GREEN, PLASTIC, TSSOP-28 |
| 文件頁數： | 19/25頁 |
| 文件大小： | 884K |
| 代理商： | THS1230IPW |
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TERMINAL FUNCTIONS
ABSOLUTE MAXIMUM RATINGS
(1)
THS1230
SLAS291B – OCTOBER 2000 – REVISED MARCH 2004
TERMINAL
I/O
DESCRIPTION
NAME
NO.
AGND
1, 7
I
Analog ground
AVDD
8, 27
I
Analog supply
AIN+
5
I
Positive analog input
AIN-
6
I
Negative analog input
CLK
28
I
ADC conversion clock
CON1
2
I
Configuration input 1
CON0
3
I
Configuration input 0
DGND
19
I
Digital ground
DVDD
20
I
Digital supply
D11
12
O
ADC data bit 11
D10
13
O
ADC data bit 10
D9
14
O
ADC data bit 9
D8
15
O
ADC data bit 8
D7
16
O
ADC data bit 7
D6
17
O
ADC data bit 6
D5
18
O
ADC data bit 5
D4
21
O
ADC data bit 4
D3
22
O
ADC data bit 3
D2
23
O
ADC data bit 2
D1
24
O
ADC data bit 1
D0
25
O
ADC data bit 0
EXTREF
4
I
Reference select input (high = external, low = internal)
OVRNG
11
O
Out of range indicator (high = out of range)
OE
26
I
Output enable (high = disable, low = enable)
REFT
9
I/O
Upper ADC reference voltage
REFB
10
I/O
Lower ADC reference voltage
over operating free-air temperature range (unless otherwise noted)
UNIT
AVDD to AGND, DVDD to DGND
–0.3 V to 4 V
Supply voltage range
AGND to DGND
–0.3 V to 0.3 V
Reference voltage input range, REFT, REFB to AGND
–0.3 to AVDD + 0.3 V
Analog input voltage range, AIN+, AIN- to AGND
–0.3 to AVDD + 0.3 V
Clock input voltage range, CLK to AGND
–0.3 to AVDD + 0.3 V
Digital input voltage range, digital input to DGND
–0.3 to DVDD + 0.3 V
Digital output voltage range, digital output to DGND
–0.3 to DVDD + 0.3 V
Operating junction temperature range, TJ
–40
°C to 150°C
Storage temperature range, TSTG
– 65
°C to 150°C
Lead temperature 1,6 mm (1/16 in) from case for 10 seconds
300
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3
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