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參數資料
| 型號： | TLV5626CDG4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 2.8 us SETTLING TIME, 8-BIT DAC, PDSO8 |
| 封裝： | PLASTIC, SOIC-8 |
| 文件頁數： | 15/19頁 |
| 文件大?。?/td> | 424K |
| 代理商： | TLV5626CDG4 |
TLV5626
2.7-V TO 5.5-V LOW-POWER DUAL 8-BIT DIGITAL-TO-ANALOG
CONVERTER WITH INTERNAL REFERENCE AND POWER DOWN
SLAS236A –JUNE 1999 – REVISED JUNE 2000
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
reference pin configured as output (REF)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Vref(OUTL)
Low reference voltage
1.003
1.024
1.045
V
Vref(OUTH)
High reference voltage
VDD > 4.75 V
2.027
2.048
2.069
V
Iref(source)
Output source current
1
mA
Iref(sink)
Output sink current
–1
mA
Load capacitance
100
pF
PSRR
Power supply rejection ratio
–65
dB
reference pin configured as input (REF)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VI
Input voltage
0
VDD–1.5
V
RI
Input resistance
10
M
CI
Input capacitance
5
pF
Reference input bandwidth
REF=0 2V
+1 024Vdc
Fast
1.3
MHz
Reference input bandwidth
REF = 0.2 Vpp + 1.024 V dc
Slow
525
kHz
Reference feedthrough
REF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10)
–80
dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
digital inputs
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IIH
High-level digital input current
VI = VDD
1
A
IIL
Low-level digital input current
VI = 0 V
–1
A
Ci
Input capacitance
8
pF
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t (FS)
Output settling time full scale
RL = 10 k,CL = 100 pF,
Fast
0.8
2.4
s
ts(FS)
Output settling time, full scale
L
,
L
,
See Note 11
Slow
2.8
5.5
s
t (CC)
Output settling time code to code
RL = 10 k,CL = 100 pF,
Fast
0.4
1.2
s
ts(CC)
Output settling time, code to code
L
,
L
,
See Note 12
Slow
0.8
1.6
s
SR
Slew rate
RL = 10 k,CL = 100 pF,
Fast
12
V/
s
SR
Slew rate
L
,
L
,
See Note 13
Slow
1.8
V/
s
Glitch energy
DIN = 0 to 1,
fCLK = 100 kHz,
CS = VDD
5
nV–S
SNR
Signal-to-noise ratio
53
57
S/(N+D)
Signal-to-noise + distortion
fs = 480 kSPS, fout = 1 kHz,
48
47
dB
THD
Total harmonic distortion
s
,
out
,
RL = 10 k,CL = 100 pF
–50
–48
dB
SFDR
Spurious free dynamic range
50
62
NOTES: 11. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFD0 or 0xFD0 to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within
± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
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