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參數資料
| 型號： | TS3DS10224RUKR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 多路復用及模擬開關 |
| 英文描述： | DIFFERENTIAL MULTIPLEXER, PQCC20 |
| 封裝： | 3 X 3 MM, 0.40 MM PITCH, PLASTIC, QFN-20 |
| 文件頁數： | 2/17頁 |
| 文件大?。?/td> | 372K |
| 代理商： | TS3DS10224RUKR |
CL
(see Note A)
TEST CIRCUIT
S1
2 × VCC
Open
GND
RL
VOH
VOL
VOLTAGE WAVEFORMS
OUTPUT SKEW (tsk(o))
Data Out at
YB1 or YB 2
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤10 MHz, ZO = 50 , tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
50
VG1
VCC
DUT
50
VIN
50
VG2
50
VI
Input Generator
VO
(VOH + VOL)/2
VOH
VOL
Data Out at
XB1 or XB 2
(VOH + VOL)/2
3.0 V
0 V
Data In at
Ax or Ay
tPLHx
tPHLx
tsk(o)
tPLHy
tPHLy
tsk(o) = tPLHy tPLHx or tPHLy tPHLx
VOH
VOL
VOLTAGE WAVEFORMS
PULSE SKEW [t sk(p)]
Output
(VOH + VOL)/2
Input
tPLH
tPHL
tsk(p) = tPHL tPLH
VO
VI
VO
1.5 V
3.0 V
0 V
1.5 V
TEST
RL
S1
CL
3.3 V ± 0.3 V
VCC
Vin
tsk(p)
tsk(o)
3.3 V ± 0.3V
Open
50
VCC or GND
2 pF
50
SCDS318
– JUNE 2011
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 10. Test Circuit and Voltage Waveforms
10
Copyright
2011, Texas Instruments Incorporated
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