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參數資料
| 型號： | TSL235RSM-LF |
| 廠商： | AMS-TAOS USA Inc |
| 文件頁數： | 6/11頁 |
| 文件大?。?/td> | 716K |
| 描述： | IC LIGHT TO FREQUENCY CONV 3SMD |
| 標準包裝： | 1 |
| 系列： | * |
| 其它名稱： | TSL235-RSM-LFDKR TSL235-RSM-LFDKR-ND TSL235RSM-LFDKR |
TSL235R
LIGHT-TO-FREQUENCY CONVERTER
TAOS038E SEPTEMBER 2007
5
The LUMENOLOGY r Company
r
r
Copyright E 2007, TAOS Inc.
www.taosinc.com
APPLICATION INFORMATION
Power-supply considerations
Power-supply lines must be decoupled by a 0.01-糉 to 0.1-糉 capacitor with short leads placed close to the
TSL235R (Figure 6).
Output interface
The output of the device is designed to drive a standard TTL or CMOS logic input over short distances. If lines
greater than 12 inches are used on the output, a buffer or line driver is recommended.
Measuring the frequency
The choice of interface and measurement technique depends on the desired resolution and data-acquisition
rate. For maximum data-acquisition rate, period-measurement techniques are used.
Period measurement requires the use of a fast reference clock with available resolution directly related to
reference-clock rate. The technique is employed to measure rapidly varying light levels or to make a fast
measurement of a constant light source.
Maximum resolution and accuracy may be obtained using frequency-measurement, pulse-accumulation,
or integration techniques. Frequency measurements provide the added benefit of averaging out random- or
high-frequency variations (jitter) resulting from noise in the light signal. Resolution is limited mainly by available
counter registers and allowable measurement time. Frequency measurement is well suited for slowly varying
or constant light levels and for reading average light levels over short periods of time. Integration, the
accumulation of pulses over a very long period of time, can be used to measure exposure the amount of light
present in an area over a given time period.
TSL235R
Timer/Port
MCU
0.1 ?/SPAN>F
V
DD
2
3
1
Figure 6. Typical TSL235R Interface to a Microcontroller
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