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參數資料
| 型號： | 5962-8876906KFC |
| 英文描述： | Wide Supply Voltage Optocouplers(密封，低IF，寬電壓，邏輯門光耦合器) |
| 中文描述： | 寬電源電壓光耦合器（密封，低中頻，寬電壓，邏輯門光耦合器） |
| 文件頁數： | 1/2頁 |
| 文件大?。?/td> | 35K |
| 代理商： | 5962-8876906KFC |
Hermetically Sealed,
Wide Supply Voltage Optocouplers
Reliability Data Sheet
Description
The reliability data shown
includes Agilent reliability test
data from the past three years on
this product family. All of these
products use the same LEDs, the
same logic gate ICs, the same
DSCC approved packaging
materials, processes, stress
conditions and testing.
The data in Tables 1 and 2 reflect
actual test data on dual channel
devices. The single channel HCPL-
5201 data in Table 3 is inferred
from the demonstrated life test
data using the factor (1.5) found
in the “Photodiode Detector
Isolator” section of MIL-HDBK-
217, combined with any single
channel data obtained. This data
Definition of Failure
Inability to switch, i.e., “functional
failure”, is the definition of failure
in this data sheet. Specifically,
failure occurs when the device
fails to switch ON with 2 times the
minimum recommended drive
current (but not exceeding the
max. rating) or fails to switch OFF
when there is no input current.
Failure Rate Projections
The demonstrated point mean
time to failure (MTTF) is
measured at the absolute
maximum stress condition. The
failure rate projections in Tables 2
and 3 use the Arrhenius
acceleration relationship, where a
0.43 eV activation energy is used
as in the hybrid section of MIL-
HDBK-217.
Applications Information
The data of Tables 1, 2, and 3 were
obtained on MIL-PRF-38534
screened devices with high
temperature operating life
duration up to 5000 hours. An
exponential (random) failure
distribution is assumed, expressed
in units of FIT (failures per billion
is taken from testing on Agilent
Technologies’ devices using
internal Agilent processes,
material specifications, design
standards, and statistical process
controls. THEY ARE NOT
TRANSFERABLE TO OTHER
MANUFACTURERS’ SIMILAR
PART TYPES.
device hours) are only defined in
the random failure portion of the
reliability curve.
For valid system reliability
calculations, it is necessary to
adjust for the time when the
system is not in operation.
Note that if you are using MIL-
HDBK-217 for predicting
component reliability, the results
may not be comparable to those
given in Tables 2 and 3 due to the
different conditions and factors
Operating Life Test
Table 1. Demonstrated Operating Life Test Performance, HCPL-5231
Demonstrated
MTTF (hr)@
T
A
= +125
°
C
1,747,000
Demonstrated
FITs @
T
A
= +125
°
C
572
Stress Test
Condition
Total Devices
Tested
Total Device
Hours
Number of
Failed Units
I
f
= 8 mA
I
out
= -15 mA
V
CC
= 20 V
T
A
= +125
°
C
T
j
= +155
°
C
430
1,747,000
1
Agilent
5962-8876901PX, 5962-8876904KPX
HCPL-5231, HCPL-523K
5962-8876801PX, 5962-8876802KPX
HCPL-5201, HCPL-520K
5962-88769022A, 5962-8876905K2A
HCPL-6231, HCPL-623K
5962-8876903FC, 5962-8876906KFC
HCPL-6251, HCPL-625K
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