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參數資料
型號: AD7707BRU
廠商: ANALOG DEVICES INC
元件分類: ADC
英文描述: 3 V/5 V, +-10 V Input Range, 1 mW 3-Channel 16-Bit, Sigma-Delta ADC
中文描述: 3-CH 16-BIT DELTA-SIGMA ADC, SERIAL ACCESS, PDSO20
封裝: LOW PROFILE, TSSOP-20
文件頁數: 5/40頁
文件大小: 316K
代理商: AD7707BRU
REV. A
AD7707
–5–
TIMING CHARACTERISTICS
1, 2
Limit at
T
MIN
, T
MAX
(B Version)
Parameter
Units
Conditions/Comments
f
CLKIN3, 4
400
5
0.4
×
t
CLKIN
0.4
×
t
CLKIN
500
×
t
CLKIN
100
kHz min
MHz max
ns min
ns min
ns nom
ns min
Master Clock Frequency: Crystal Oscillator or Externally Supplied for
Specified Performance
Master Clock Input Low Time. t
CLKIN
= 1/f
CLKIN
Master Clock Input High Time
DRDY
High Time
RESET
Pulsewidth
t
CLKIN
LO
t
CLKIN
HI
t
1
t
2
Read Operation
t
3
t
4
t
55
0
120
0
80
100
100
100
0
10
60
100
100
ns min
ns min
ns min
ns max
ns max
ns min
ns min
ns min
ns min
ns max
ns max
ns max
DRDY
to
CS
Setup Time
CS
Falling Edge to SCLK Rising Edge Setup Time
SCLK Falling Edge to Data Valid Delay
DV
DD
= +5V
DV
DD
= +3.0V
SCLK High Pulsewidth
SCLK Low Pulsewidth
CS
Rising Edge to SCLK Rising Edge Hold Time
Bus Relinquish Time after SCLK Rising Edge
DV
DD
= +5V
DV
DD
= +3.0V
SCLK Falling Edge to
DRDY
High
7
t
6
t
7
t
8
t
96
t
10
Write Operation
t
11
t
12
t
13
t
14
t
15
t
16
120
30
20
100
100
0
ns min
ns min
ns min
ns min
ns min
ns min
CS
Falling Edge to SCLK Rising Edge Setup Time
Data Valid to SCLK Rising Edge Setup Time
Data Valid to SCLK Rising Edge Hold Time
SCLK High Pulsewidth
SCLK Low Pulsewidth
CS
Rising Edge to SCLK Rising Edge Hold Time
NOTES
1
Sample tested at +25
°
C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of DV
DD
) and timed from a voltage level of 1.6 V.
2
See Figures 16 and 17.
3
f
CLKIN
Duty Cycle range is 45% to 55%. f
CLKIN
must be supplied whenever the AD7707 is not in Standby mode. If no clock is present in this case, the device can
draw higher current than specified and possibly become uncalibrated.
4
The AD7707 is production tested with f
CLKIN
at 2.4576MHz (1MHz for some I
DD
tests). It is guaranteed by characterization to operate at 400kHz.
5
These numbers are measured with the load circuit of Figure 1 and defined as the time required for the output to cross the V
OL
or V
OH
limits.
6
These numbers are derived from the measured time taken by the data output to change 0.5V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and as such are independent of external bus loading capacitances.
7
DRDY
returns high after the first read from the device after an output update. The same data can be read again, if required, while
DRDY
is high, although care
should be taken that subsequent reads do not occur close to the next output update.
TO OUTPUT
PIN
50pF
I
SINK
(800
m
A AT V
DD
= +5V
100
m
A AT V
DD
= +3V)
+1.6V
I
SOURCE
(200
m
A AT V
DD
= +5V
100
m
A AT V
DD
= +3V)
Figure 1. Load Circuit for Access Time and Bus Relinquish Time
(AV
DD
= DV
DD
= +2.7 V TO +5.25 V, AGND = DGND = 0 V; f
CLKIN
= 2.4576 MHz; Input
Logic = 0, Logic 1 = DV
DD
unless otherwise noted.)
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