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參數(shù)資料
| 型號： | AD7778 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs |
| 中文描述： | LC2MOS，高速1 - ，4 - |
| 文件頁數(shù)： | 3/12頁 |
| 文件大小： | 220K |
| 代理商： | AD7778 |
AD7776/AD7777/AD7778
–3–
REV. 0
TIMNGSPECIFICATIONS
1, 2
(V
CC
= +5 V
6
5%; AGND = DGND = 0 V; all specifications T
MN
to T
MAX
unless otherwse noted.)
t
3
t
11
t
10
t
9
t
8
FIRST
CONVERSION
FINISHED
(CR6 = 0)
SECOND
CONVERSION
FINISHED (CR6 = 1)
AD7777/AD7778 ONLY
t
9
BUSY
(CR8 = 0)
INT
(CR8 = 1)
t
10
WR, RD
Figure 3.
BUSY
/
INT
Timing
I
OL
1.6mA
+2.1V
I
OH
200
μ
A
C
OUT
100pF
DB n
Figure 4. Load Circuit for Bus Timing Characteristics
t
1
CS
t
2
t
4
t
5
RD
DB0–DB9
Figure 1. Read Cycle Timing
t
1
CS
t
2
t
6
WR
DB0–DB9
t
3
t
7
Figure 2. Write Cycle Timing
Parameter
Label
Limit at T
MIN
to T
MAX
Units
T est Conditions/Comments
INT ERFACE T IMING
CS
Falling Edge to
WR
or
RD
Falling Edge
WR
or
RD
Rising Edge to
CS
Rising Edge
WR
Pulse Width
CS
or
RD
Active to Valid Data
3
Bus Relinquish T ime after
RD
4
t
1
t
2
t
3
t
4
t
5
0
0
53
60
10
45
55
10
1.5 t
CLK IN
2.5 t
CLK IN
+ 70
ns min
ns min
ns min
ns max
ns min
ns max
ns min
ns min
ns min
ns max
T imed from Whichever Occurs Last
Data Valid to
WR
Rising Edge
Data Valid after
WR
Rising Edge
WR
Rising Edge to
BUSY
Falling Edge
t
6
t
7
t
8
CR9 = 0
WR
Rising Edge to
BUSY
Rising Edge or
INT
Falling Edge
t
9
t
10
t
11
19.5 t
CLK IN
+ 70
33.5 t
CLK IN
+ 70
60
ns max
ns max
ns max
Single Conversion, CR6 = 0
Double Conversion, CR6 = 1
CR9 = 1
WR
or
RD
Falling Edge to
INT
Rising Edge
NOT ES
1
See Figures 1 to 3.
2
T iming specifications in
bold
print are 100% production tested. All other times are guaranteed by design, not production tested. All input signals are specified with
tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
3
t
4
is measured with the load circuit of Figure 4 and defined as the time required for an output to cross 0.8 V or 2.4 V.
4
t
is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 4. T he measured time is then extrapolated back
to remove the effects of charging or discharging the 100 pF capacitor. T his means that the time t
5
quoted above is the true bus relinquish time of the device and, as
such, is independent of the external bus loading capacitance.
Specifications subject to change without notice.
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