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參數資料
型號: AD7847
廠商: Analog Devices, Inc.
英文描述: LC2MOS Complete, Dual 12-Bit MDACs
中文描述: LC2MOS完成,雙12位醫療儀器行政管理制度
文件頁數: 4/12頁
文件大小: 187K
代理商: AD7847
AD7837/AD7847
REV. C
–4–
TERMINOLOGY
Relative Accuracy (Linearity)
Relative accuracy, or endpoint linearity, is a measure of the
maximum deviation of the DAC transfer function from a
straight line passing through the endpoints. It is measured after
allowing for zero and full-scale errors and is expressed in LSBs
or as a percentage of full-scale reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of
±
1 LSB or less
over the operating temperature range ensures monotonicity.
Zero Code Offset Error
Zero code offset error is the error in output voltage from V
OUTA
or V
OUTB
with all 0s loaded into the DAC latches. It is due to a
combination of the DAC leakage current and offset errors in the
output amplifier.
Gain Error
Gain error is a measure of the output error between an ideal
DAC and the actual device output with all 1s loaded. It does
not include offset error.
Total Harmonic Distortion
This is the ratio of the root-mean-square (rms) sum of the har-
monics to the fundamental, expressed in dBs.
Multiplying Feedthrough Error
This is an ac error due to capacitive feedthrough from the V
REF
input to V
OUT
of the same DAC when the DAC latch is loaded
with all 0s.
Channel-to-Channel Isolation
This is an ac error due to capacitive feedthrough from the V
REF
input on one DAC to V
OUT
on the other DAC. It is measured
with the DAC latches loaded with all 0s.
Digital Feedthrough
Digital feedthrough is the glitch impulse injected from the digi-
tal inputs to the analog output when the data inputs change state,
but the data in the DAC latches is not changed.
For the AD7837, it is measured with
LDAC
held high. For the
AD7847, it is measured with
CSA
and
CSB
held high.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one converter due to a change in digital code on the DAC
latch of the other converter. It is specified in nV secs.
Digital-to-Analog Glitch Impulse
This is the voltage spike that appears at the output of the DAC
when the digital code changes, before the output settles to its
final value. The energy in the glitch is specified in nV secs and is
measured for a 1 LSB change around the major carry transition
(0111 1111 1111 to 1000 0000 0000 and vice versa).
Unity Gain Small Signal Bandwidth
This is the frequency at which the small signal voltage output
from the output amplifier is 3 dB below its dc level. It is mea-
sured with the DAC latch loaded with all 1s.
Full Power Bandwidth
This is the maximum frequency for which a sinusoidal input
signal will produce full output at rated load with a distortion
less than 3%. It is measured with the DAC latch loaded with
all 1s.
AD7837 PIN FUNCTION DESCRIPTION (DIP AND SOIC PIN NUMBERS)
Pin
Mnemonic
Description
1
2
3
4
5
6
7
8
9
10
11
12
13
CS
R
FBA
V
REFA
V
OUTA
AGNDA
V
DD
V
SS
AGNDB
V
OUTB
V
REFB
DGND
R
FBB
WR
Chip Select. Active low logic input. The device is selected when this input is active.
Amplifier Feedback Resistor for DAC A.
Reference Input Voltage for DAC A. This may be an ac or dc signal.
Analog Output Voltage from DAC A.
Analog Ground for DAC A.
Positive Power Supply.
Negative Power Supply.
Analog Ground for DAC B.
Analog Output Voltage from DAC B.
Reference Input Voltage for DAC B. This may be an ac or dc signal.
Digital Ground. Ground reference for digital circuitry.
Amplifier Feedback Resistor for DAC B.
Write Input.
WR
is an active low logic input which is used in conjunction with
CS
, A0 and A1 to
write data to the input latches.
DAC Update Logic Input. Data is transferred from the input latches to the DAC latches when
LDAC
is taken low.
Address Input. Most significant address input for input latches (see Table II).
Address Input. Least significant address input for input latches (see Table II).
Data Bit 7 to Data Bit 4.
Data Bit 3 to Data Bit 0 (LSB) or Data Bit 11 (MSB) to Data Bit 8.
14
LDAC
15
16
17–20
21–24
A1
A0
DB7–DB4
DB3–DB0
相關PDF資料
PDF描述
AD7847AN LC2MOS Complete, Dual 12-Bit MDACs
AD7847AQ LC2MOS Complete, Dual 12-Bit MDACs
AD7847AR LC2MOS Complete, Dual 12-Bit MDACs
AD7847BN LC2MOS Complete, Dual 12-Bit MDACs
AD7847BQ LC2MOS Complete, Dual 12-Bit MDACs
相關代理商/技術參數
參數描述
AD7847AN 功能描述:IC DAC 12BIT MULT DUAL 24-DIP RoHS:否 類別:集成電路 (IC) >> 數據采集 - 數模轉換器 系列:- 產品培訓模塊:Data Converter Fundamentals DAC Architectures 標準包裝:750 系列:- 設置時間:7µs 位數:16 數據接口:并聯 轉換器數目:1 電壓電源:雙 ± 功率耗散(最大):100mW 工作溫度:0°C ~ 70°C 安裝類型:表面貼裝 封裝/外殼:28-LCC(J 形引線) 供應商設備封裝:28-PLCC(11.51x11.51) 包裝:帶卷 (TR) 輸出數目和類型:1 電壓,單極;1 電壓,雙極 采樣率(每秒):143k
AD7847AN/883B 制造商:AD 制造商全稱:Analog Devices 功能描述:LC2MOS Complete, Dual 12-Bit MDACs
AD7847AN883B 制造商:AD 制造商全稱:Analog Devices 功能描述:LC2MOS Complete, Dual 12-Bit MDACs
AD7847AN-883B 制造商:AD 制造商全稱:Analog Devices 功能描述:LC2MOS Complete, Dual 12-Bit MDACs
AD7847ANN 制造商:AD 制造商全稱:Analog Devices 功能描述:LC2MOS Complete, Dual 12-Bit MDACs
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