- 您現在的位置：買賣IC網 > PDF目錄374043 > ADUM3100BRZ (ANALOG DEVICES INC) Digital Isolator, Enhanced System-Level ESD Reliability PDF資料下載
參數資料
| 型號： | ADUM3100BRZ |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 模擬信號調理 |
| 英文描述： | Digital Isolator, Enhanced System-Level ESD Reliability |
| 中文描述： | SPECIALTY ANALOG CIRCUIT, PDSO8 |
| 封裝： | ROHS COMPLIANT, MS-012AA, SOIC-8 |
| 文件頁數： | 13/16頁 |
| 文件大小： | 289K |
| 代理商： | ADUM3100BRZ |
ADuM3100
APPLICATIONS
PC BOARD LAYOUT
The ADuM3100 digital isolator requires no external interface
circuitry for the logic interfaces. A bypass capacitor is
recommended at the input and output supply pins. The input
bypass capacitor can conveniently connect between Pin 3 and
Pin 4 (see Figure 12). Alternatively, the bypass capacitor can be
located between Pin 1 and Pin 4. The output bypass capacitor
can be connected between Pin 7 and Pin 8 or Pin 5 and Pin 8.
The capacitor value should be between 0.01 μF and 0.1 μF. The
total lead length between both ends of the capacitor and the
power supply pins should not exceed 20 mm.
Rev. A | Page 13 of 16
V
DD1
V
1
(DATA)
GND
1
V
DD2
V
O
(DATA OUT)
GND
2
(OPTIONAL)
0
Figure 12. Recommended Printed Circuit Board Layout
SYSTEM-LEVEL ESD CONSIDERATIONS AND
ENHANCEMENTS
System-level ESD reliability (for example, per IEC 61000-4-x)
is highly dependent on system design which varies widely by
application. The ADuM3100 incorporates many enhancements
to make ESD reliability less dependent on system design. The
enhancements include:
ESD protection cells added to all input/output interfaces.
Key metal trace resistances reduced using wider geometry
and paralleling of lines with vias.
The SCR effect inherent in CMOS devices minimized by use
of guarding and isolation technique between PMOS and
NMOS devices.
Areas of high electric field concentration eliminated using
45° corners on metal traces.
Supply pin overvoltage prevented with larger ESD clamps
between each supply pin and its respective ground.
While the ADuM3100 improves system-level ESD reliability, it
is no substitute for a robust system-level design. See
Application
Note AN-793, ESD/Latch-Up Considerations with
i
Coupler
Isolation Products
for detailed recommendations on board
layout and system-level design.
PROPAGATION DELAY-RELATED PARAMETERS
Propagation delay time describes the length of time it takes for a
logic signal to propagate through a component. Propagation
delay time to logic low output and propagation delay time to
logic high output refer to the duration between an input signal
transition and the respective output signal transition
(see Figure 13).
INPUT (V
I
)
OUTPUT (V
O
)
t
PLH
t
PHL
50%
50%
0
Figure 13. Propagation Delay Parameters
Pulse-width distortion is the maximum difference between t
PLH
and t
PHL
and provides an indication of how accurately the input
signal timing is preserved in the component output signal.
Propagation delay skew is the difference between the minimum
and maximum propagation delay values among multiple
ADuM3100 components operated at the same operating
temperature and having the same output load.
Depending on the input signal rise/fall time, the measured
propagation delay based on the input 50% level can vary from
the true propagation delay of the component (as measured from
its input switching threshold). This is due to the fact that the
input threshold, as is the case with commonly used optocouplers,
is at a different voltage level than the 50% point of typical input
signals. This propagation delay difference is:
Δ
LH
=
t
′
PLH
t
PLH
= (
t
r
/0.8
V
I
)(0.5
V
1
V
ITH (L-H)
)
Δ
HL
= t
′
PHL
t
PHL
= (
t
f
/0.8
V
I
)(0.5
V
1
V
ITH (H-L)
)
where:
t
PLH
,
t
PHL
= propagation delays as measured from the input
50%.
t
′
PLH
,
t
′
PHL
= propagation delays as measured from the input
switching thresholds.
t
r
,
t
f
= input 10% to 90% rise/fall time.
V
I
= amplitude of input signal (0 to V
I
levels assumed).
V
ITH (L–H)
,
V
ITH (H–L)
= input switching thresholds.
Δ
LH
V
ITH(H–L)
INPUT (V
I
)
V
ITH(L–H)
V
I
Δ
HL
t
PHL
t'
PHL
t
PLH
t'
PLH
OUTPUT (V
O
)
50%
50%
0
Figure 14. Impact of Input Rise/Fall Time on Propagation Delay
相關PDF資料 |
PDF描述 |
|---|---|
| ADUM3100BRZ-RL7 | Digital Isolator, Enhanced System-Level ESD Reliability |
| ADUM3200BRZ | Dual-Channel, Digital Isolators, Enhanced System-Level ESD Reliability |
| ADUM3200BRZ-RL7 | Dual-Channel, Digital Isolators, Enhanced System-Level ESD Reliability |
| ADUM3200 | Dual-Channel, Digital Isolators, Enhanced System-Level ESD Reliability |
| ADUM3200ARZ | Dual-Channel, Digital Isolators, Enhanced System-Level ESD Reliability |
相關代理商/技術參數 |
參數描述 |
|---|---|
| ADUM3100BRZ-RL7 | 功能描述:IC DIGITAL ISOLATOR SGL 8-SOIC RoHS:是 類別:隔離器 >> 數字隔離器 系列:iCoupler® 產品培訓模塊:IsoLoop® Isolator 標準包裝:50 系列:IsoLoop® 輸入 - 1 側/2 側:5/0 通道數:5 電源電壓:3 V ~ 5.5 V 電壓 - 隔離:2500Vrms 數據速率:110Mbps 傳輸延遲:12ns 輸出類型:CMOS 封裝/外殼:16-SOIC（0.154"，3.90mm 寬） 供應商設備封裝:16-SOIC N 包裝:管件 工作溫度:-40°C ~ 85°C 其它名稱:390-1053-5 |
| ADUM3123ARZ | 功能描述:4A Gate Driver Magnetic Coupling 3000Vrms 1 Channel 8-SOIC 制造商:analog devices inc. 系列:iCoupler? 包裝:管件 零件狀態:有效 技術:磁耦合 通道數:1 電壓 - 隔離:3000Vrms 共模瞬態抗擾度（最小值）:50kV/μs 傳播延遲 tpLH / tpHL（最大值）:68ns，68ns 脈寬失真（最大）:- 上升/下降時間（典型值）:12ns，12ns 電流 - 輸出高，低:- 電流 - 峰值輸出:4A 電壓 - 正向（Vf）（典型值）:- 電流 - DC 正向（If）:- 電壓 - 電源:4.5 V ~ 18 V 工作溫度:-40°C ~ 125°C 安裝類型:表面貼裝 封裝/外殼:8-SOIC（0.154"，3.90mm 寬） 供應商器件封裝:8-SOIC 認可:CSA，UR，VDE 標準包裝:98 |
| ADUM3123ARZ-RL7 | 功能描述:4A Gate Driver Magnetic Coupling 3000Vrms 1 Channel 8-SOIC 制造商:analog devices inc. 系列:iCoupler? 包裝:帶卷（TR） 零件狀態:有效 技術:磁耦合 通道數:1 電壓 - 隔離:3000Vrms 共模瞬態抗擾度（最小值）:50kV/μs 傳播延遲 tpLH / tpHL（最大值）:68ns，68ns 脈寬失真（最大）:- 上升/下降時間（典型值）:12ns，12ns 電流 - 輸出高，低:- 電流 - 峰值輸出:4A 電壓 - 正向（Vf）（典型值）:- 電流 - DC 正向（If）:- 電壓 - 電源:4.5 V ~ 18 V 工作溫度:-40°C ~ 125°C 安裝類型:表面貼裝 封裝/外殼:8-SOIC（0.154"，3.90mm 寬） 供應商器件封裝:8-SOIC 認可:CSA，UR，VDE 標準包裝:1,000 |
| ADUM3123BRZ | 功能描述:4A Gate Driver Magnetic Coupling 3000Vrms 1 Channel 8-SOIC 制造商:analog devices inc. 系列:iCoupler? 包裝:管件 零件狀態:有效 技術:磁耦合 通道數:1 電壓 - 隔離:3000Vrms 共模瞬態抗擾度（最小值）:50kV/μs 傳播延遲 tpLH / tpHL（最大值）:62ns，62ns 脈寬失真（最大）:- 上升/下降時間（典型值）:12ns，12ns 電流 - 輸出高，低:- 電流 - 峰值輸出:4A 電壓 - 正向（Vf）（典型值）:- 電流 - DC 正向（If）:- 電壓 - 電源:7.4 V ~ 18 V 工作溫度:-40°C ~ 125°C 安裝類型:表面貼裝 封裝/外殼:8-SOIC（0.154"，3.90mm 寬） 供應商器件封裝:8-SOIC 認可:CSA，UR，VDE 標準包裝:98 |
| ADUM3123BRZ-RL7 | 功能描述:4A Gate Driver Magnetic Coupling 3000Vrms 1 Channel 8-SOIC 制造商:analog devices inc. 系列:iCoupler? 包裝:帶卷（TR） 零件狀態:有效 技術:磁耦合 通道數:1 電壓 - 隔離:3000Vrms 共模瞬態抗擾度（最小值）:50kV/μs 傳播延遲 tpLH / tpHL（最大值）:62ns，62ns 脈寬失真（最大）:- 上升/下降時間（典型值）:12ns，12ns 電流 - 輸出高，低:- 電流 - 峰值輸出:4A 電壓 - 正向（Vf）（典型值）:- 電流 - DC 正向（If）:- 電壓 - 電源:7.4 V ~ 18 V 工作溫度:-40°C ~ 125°C 安裝類型:表面貼裝 封裝/外殼:8-SOIC（0.154"，3.90mm 寬） 供應商器件封裝:8-SOIC 認可:CSA，UR，VDE 標準包裝:1,000 |
發布緊急采購，3分鐘左右您將得到回復。